Additional Adjusting For Scanning With Afm Head - NT-MDT NTEGRA Spectra Instruction Manual

NTEGRA Spectra Probe NanoLaboratory. (Inverted Configuration with Renishaw Spectrometer).
for 2D scanning:
a. Enable the function of selecting the scan area by pressing the
in the Toolbar.
b. Change size and position of the scan area with the mouse.
for 3D scanning:
a. Enable the function of selecting the scan area in the XY plane by pressing the
button (Fig. 9-18) in the Toolbar.
b. Change size and position of the scan area in the XY plane with the mouse.
c. Define the upper and lower limits of scanning in the Z-direction by moving with
the mouse the sliders

9.5. Additional Adjusting for Scanning with AFM head

Confocal microscopy modes can provide data on the sample landscape along with
intrinsically optical data. This capability needs to employ the AFM measuring head (AFM-
Spectrometer configuration). Preparation for measurements includes adjustment of the scan
parameters (see above) and alignment of the probe along the lens optical axis. To align the
probe along the optical axis, perform the following steps:
1. Prepare the measuring head and mount it on the exchangeable mount.
2. Perform the prior adjustment of the Control program.
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Fig. 9-17. Scan area in XY plane
and at the right side of the scan viewer.
Fig. 9-18. Area of 3D scanning
button (F ig. 9-17 )