Other Capabilities; Afm Measurements; Snom Measurements - NT-MDT NTEGRA Spectra Instruction Manual

Chapter 10. Other Capabilities

10. Other Capabilities

10.1. AFM Measurements

Availability of the AFM measuring head allows for measurements with Atomic-Force
Microscopy.
For details on measurements with the AFM measuring head, refer to the manual
Performing measurements.

10.2. SNOM Measurements

Availability of the SNOM measuring head allows for measurements with Scanning Near-
field Optical Microscopy. The signal is detected by photoelectronic multiplier or by the
CCD-camera of the spectrometer.
For details on measurements with the AFM measuring head and with the photoelectronic
multiplier, refer to the manual NTEGRA Solaris PNL.
Exciting the sample with the laser beam of the SNOM head and detecting the signal with
the spectrometer CCD-camera, one can acquire fluorescent SNOM data.
Fluorescent SNOM measurements need to prepare the instrument as follows:
1. Prepare the SNOM measuring head and install it.
2. Approach the probe tip to the optical axis of the exchangeable mount lens.
3. Turn off the laser beam of the spectrometer.
4. Adjust the spectrometer.
Details of these operations are explained below. On completion of the preparatory
procedures, perform scan of the sample. (For details of the scan procedure, refer to i. 9.6
on p. 46).
Preparing and installing the SNOM measuring head
For details on preparing and installing the SNOM measuring head, refer to the manual
PNL NTEGRA Solaris, Ch. 3.
Hereafter only the operational sequence is presented:
1. Install the probe.
2. Bring the laser beam to the optical fiber.
3. Install the measuring head on the exchangeable mount.
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