NT-MDT NTEGRA Spectra Instruction Manual page 6

NTEGRA Spectra Probe NanoLaboratory. (Inverted Configuration with Renishaw Spectrometer).
In addition to measurements, the NTEGRA Spectra PNL facilitates to perform volumetric
lithography.
The SNOM-Spectrometer configuration allows the following:
− measuring surface topography with the Shear Force Microscopy;
− in the transmission mode, measuring optical and spectral properties of the object with
the resolution achievable by the Scanning Near-field Optical Microscopy.
The AFM-Spectrometer configuration allows the following:
− detecting the object landscape with atomic resolution as well as collecting its
electrical, magnetic and nanomechanical properties with force microscopy techniques;
− measuring optical properties relevant to the Scanning Near-Field Optical Microscopy
in scales down to atomic sizes.
The NTEGRA Spectra PNL application area includes technology processes control in
chemical, food and medicine industries, environment monitoring, isotope composition
analysis, defects control, control of impurities in pure substances, analysis of materials of
quantum electronics and semiconductor industry, fundamental research in physics,
chemistry, medicine etc.
The instrument layout is quite flexible for the experimenter to change the configuration
with units designed especially for a given purpose. The software is advanced to facilitate:
− performing spectral measurements;
− controlling the scanning mechanism, the automated optical mechanical units, the light
detection systems (CCD camera and APD module);
− displaying 3D data, filtering, analysis and saving the collected data.
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