NT-MDT NTEGRA Spectra Instruction Manual page 15

Inverted configuration with renishaw spectrometer
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Chapter 2. Design
AFM measuring head
The AFM measuring head (Fig. 2-8) is used for qualitative and quantitative measurements
of near-surface characteristics of various objects and properties of physical fields of
associated with these objects.
Fig. 2-8. AFM measuring head
1 – laser adjusting screws; 2 – photodiode adjusting screws;
3 – probe holder; 4 – housing; 5 – mounting plate; 6 – leveling posts
The measuring head consists of the mounting plate 5 with other components assembled on
it. Capacitance sensors, which determine the position of the scanner, are fixed to the
bottom of the scanner. The end of the scanner has a special holder for the probe 3.
There are three leveling posts to secure installation, horizontal leveling and approaching of
the probe to the sample. Two of them (pos. 6) are ordinary screws with fastening nuts. The
third post is a micrometer screw driven by a stepper motor 6 (motorized leveling post) that
provides the motorized translation of the probe towards the sample.
The laser adjusting screws 1 are used to aim the laser beam at the probe. The beam
reflected from the probe is acquired by the photodiode. The adjusting screws 2 provide
aligning the photodiode against the beam.
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