Xy Scanning Optical Exchangeable Mount - NT-MDT NTEGRA Spectra Instruction Manual

NTEGRA Spectra Probe NanoLaboratory. (Inverted Configuration with Renishaw Spectrometer).
– connector for the scanner or for the scanner with built-in sensors,
SCAN+SENSOR
used for connecting either the exchangeable scanner or the measuring
head scanner;
–connector of a heating element, used for connecting a heating stage, heating
Т
liquid cells etc.;
– connector of the stepper motor;
SM
– connector of the ultrasonic piezoelectric transducer;
AFAM
– bias voltage jack, used for applying bias voltage to the sample.
BV
Slots for connecting the bias unit to the control system:
– connector for connecting to the
CONTROLLER 1
controller;
– connector for connecting to the
CONTROLLER 2
SPM controller;
– connector for connecting to the thermocontroller.
CONTROLLER T

2.1.3. XY Scanning Optical Exchangeable Mount

XY Scanning Optical Exchangeable Mount (Fig. 2-4) allows:
− manual positioning of the measuring head in the XY plane;
− manual positioning of the sample by means of micrometer screws;
− precise positioning of the sample by means of the built-in XY scanner;
− manual approaching the lens to the sample by means of a stepper motor;
− fine focusing by means of the Z piezo drive of the lens.
The XY Scanning Optical Exchangeable Mount holds the investigated sample, the
measuring head, and the lens of the inverted optical microscope.
A substrate with a mounted sample is fastened to the sample stage 4 with the spring clips 5.
The seats 1 of the exchangeable mount hold the measuring head. Positioning of the
measuring head with respect to the lens is performed by means of screws 2. To select the
scan area, the sample is moved using the micrometer screws 3 of the XY positioning
device and inspected with the optical viewing system.
10
connector of the SPM
HEAD
connector of the
CONTROLLER 2