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NTEGRA Therma Probe NanoLaboratory. Instruction Manual
7. Performing Measurements
7.1. Contact AFM
The measurements by the AFM-techniques are discussed in detail in the book "Performing
measurements" Part 3, Chapter 2, Section "Constant Force Mode". Hence, only a sequence
of main operations and a detailed description of the stages which differ from the standard
procedure are given here.
Before making measurements switch off the optical microscope illuminator because
residual voltage fluctuations of the illuminator lamp cause noise at double the frequency of
the power supply voltage (100/120 Hz for mains frequency 50/60 Hz).
Basic operations of Contact Modes
1. Switching the instrument for operation in contact modes (On the main parameters panel
choose Contact in the drop-down list).
2. Landing the Sample to the Probe (see i.
3. Setting "Feedback Gain" Factor Working Level (see i.
4. Changing the Temperature of the Sample (see i.
5. Setting the Scanning Parameters and Scanning (see i.
− Scanning;
− Saving the Obtained Data.
6. Finishing the Measurements (see i.
7.1.1.
Landing the Sample to the Probe
1. Switch to the Approach tab (
see Fig. 7-1).
Since the automatic approach during sample heating (further called thermal approach)
differs from the ordinary approach procedure, an additional thermal approach panel
appears in the right part of the window.
36
7.1.1
on page 36).
7.1.3
7.1.5
on page 41).
button on the main operation panel,
Fig. 7-1. Approach tab
7.1.2
on page 39).
on page. 39).
7.1.4
on page 41).
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