Additional Cables - NT-MDT NTEGRA Spectra Instruction Manual

NTEGRA Spectra Probe NanoLaboratory. (Inverted Configuration with Renishaw Spectrometer).
1 – probe; 2 – sapphire pedestal; 3 – spring clip; 4 – trapezium lever
Design of the probe holder is shown in Fig. 2-9. The probe 1 is set on the sapphire pedestal
2 and is fixed by the spring clip 3. The clip is loosened and tightened by the trapezium
lever 4. A piezo vibrator is located under the sapphire pedestal. Its function is to excite
oscillations of the cantilever at a given frequency during measurements on semi-contact
techniques.
Technical specifications of the AFM measuring head:
Scan range:
− in XY plane
− in Z direction

2.1.5. Additional Cables

For AFM spectrometry or for SNOM spectrometry, the X- and Y-scanners of the
exchangeable mount and the Z-scanner of the measuring head are connected to the main
controller while the X- and Y-scanners of the measuring head and the Z-scanner of the lens
are connected to the slave controller. This arrangement allows:
− moving the probe in XY plane for its precise alignment along the optical axis of the
lens;
− selecting the scan area and approaching the probe to the selected region of the sample
surface;
− confocal scanning for taking the surface topography (the configuration AFM-
Spectrometer).
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Fig. 2-9. Probe holder assembly
100×100 m
10 m