Digital-To-Analog Converter (Dac); Table 63. Dac_Sm_0; Table 64. Dac_Sm_1 - ST STM32F2 Series User Manual

3.6.13

Digital-to-analog converter (DAC)

SM CODE
Description
Ownership
Detailed implementation
Error reporting
Fault detection time
Addressed fault model
Dependency on MCU configuration
Initialization
Periodicity
Test for the diagnostic
Multiple faults protection
Recommendations and known limitations
SM CODE
Description
Ownership
Detailed implementation
Error reporting
Fault detection time
Addressed fault model
Dependency on MCU configuration
Initialization
Periodicity
Test for the diagnostic
Multiple faults protection
Recommendations and known limitations
UM1845 - Rev 4
Table 63. DAC_SM_0
DAC_SM_0
Periodical read-back of configuration registers
End user
This method must be applied to DAC configuration registers.
Detailed information on the implementation of this method can be found in
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Refer to NVIC_SM_0
Table 64. DAC_SM_1
DAC_SM_1
DAC output loopback on ADC channel
End user
Implementation is realized by routing the active DAC output to one ADC channel, and by checking
the output current value with his expected one
Depends on implementation
Depends on implementation
Permanent and Transient
None
Depends on implementation
Continuous or on demand
Not needed
CPU_SM_0: periodical core self-test software
Efficiency versus transient failures is linked to final application characteristics. We define as Tm the
minimum duration of DAC wrong signal permanence required to violate the related safety
function(s). Efficiency is maximized when execution test frequency is higher than 1/Tm
Description of hardware and software diagnostics
UM1845
Section 3.6.5
page 47/108