Internal Temperature - ST STM32F2 Series User Manual
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Also See for STM32F2 Series:
- User manual (1372 pages) ,
- Application note (56 pages) ,
- User manual (19 pages)
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4.2.4
Internal temperature
The abnormal increase of the internal temperature is a potential source of dependent failures, because it can
affect many MCU parts and therefore lead to not-independent failures. The safety mechanism to be used to
mitigate this potential effect is the following:
•
VSUP_SM_3: the internal temperature read and check allow the user to quickly detect potential risky
conditions before they lead to a series of internal failures. Refer to
detailed safety mechanism descriptions.
UM1845 - Rev 4
Dependent failures analysis
Section 3.6.18 Power control
UM1845
for the
page 85/108
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