Keysight Technologies B1500A User Manual page 49

Semiconductor device analyzer
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Classic Test
Tracer Test
Quick Test
You can perform measurements by using the user interface similar to the
semiconductor parameter analyzers such as Keysight 4156C. The setup can be made
by entering values into the setup tables used for the measurement module control.
And it can be saved and recalled as your setup (My Favorite Setup). This
measurement environment provides the following functions.
I/V Sweep
Multi Channel I/V Sweep
I/V List Sweep
I/V-t Sampling
C-V Sweep
SPGU Control
Switching Matrix Control
Direct Control
The Direct Control test mode is used to control the measurement modules directly
by using the B1500A GPIB control commands and perform measurement. For the
control commands, see "Programming Guide".
Curve tracer test mode. This test allows you to perform the high speed I-V
measurement on one screen. The Tracer Test screen provides GUI for selecting the
used channels, setting the sweep output, and displaying the measurement result
(tracing the I-V curve). Range of the sweep output and measurement can be changed
by the rotary knob on the front panel.
Tracer test also provides the oscilloscope view to display the pulse current or
voltage output waveform of the MCSMU. You can verify output waveform over the
I-V curve.
You can execute the test setups saved in a preset group (My Favorite Setup)
sequentially.
Keysight B1500A User's Guide, Ed ition 14
Introduction
Overview
2- 7

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