Keysight Technologies B1500A User Manual page 180

Semiconductor device analyzer
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Table 4-22
Voltage applied to DUT
Current applied to DUT
Applied
Recommended
voltage
minimum pulse
condition
width
Current
Measurement Range
measurement
Recommended
condition
minimum
measurement
window
Settling time
Noise (rms)
a. Recommended minimum pulse width = settling time + recommended minimum measurement
window.
b. The time until the measured value settles to within ± 0.6 % of the final result value after the out-
put voltage is changed from the initial value (0 V). Minimum rise/fall time of 70 ns is recom-
mended for minimizing overshoot.
c. RMS noise measured over the recommended minimum measurement window.
1. Measurement conditions: The DUT is a resistive load chosen to adjust the flowing current to the
specified current in the table above. The capacitance of the cable between the RSU and the DUT
is 20 pF. Voltage is applied to the DUT by a channel of WGFMU/RSU in Fast IV mode and in
the 10 mA range, and current measurement is performed by another channel at 0 V in Fast IV
mode.
Specifications
Hardware
Minimum timing parameters for current measurement
100 nA
47 s
a
1 A
10 s
37 s
b
c
160 pA
4- 40
10 V
1 A
10 A
100 A
38.7 s
6.8 s
950 ns
1 A
10 A
100 A
1.64 s
1 s
130 ns
37 s
5.8 s
820 ns
425 pA
2.5 nA
47 nA
Keysight B1500A User's Guide, Ed ition 14
1
1 mA
10 mA
240 ns
145 ns
1 mA
10 mA
40 ns
20 ns
200 ns
125 ns
1.9 A
280 nA

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