Keysight Technologies B1500A User Manual page 158

Semiconductor device analyzer
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Specifications
Hardware
For MCSMU
Width: 10 s to 100 ms (1 A range), 10 s to 2 s (10 A to 100 mA ranges),
2 s resolution
Recommended pulse width:  50 s (time to reach within 1 % of the final
value at resistive load  50 , 10 V step voltage, and 1 A compliance,
supplemental characteristics)
Period: 5 ms to 5 s, 100 s resolution
Pulse duty:
For 1 A range:  5 %
For 10 A to 100 mA ranges:
Period  Width+Delay+2 ms (when Width+Delay  100 ms)
Period  Width+Delay+10 ms (when Width+Delay > 100 ms)
Delay: 0 to (Period-Width) s, 2 s resolution
About measurement accuracy
RF electromagnetic field and SMU measurement accuracy
Voltage and current measurement accuracy may be affected by RF
electromagnetic field of strength over 3 V/m at frequencies 80 MHz to
1 GHz and 1.4 GHz to 2.0 GHz, and 1 V/m at frequencies 2.0 GHz to 2.7
GHz.
The extent of this effect depends upon how the instrument is
positioned and shielded.
Induced RF field noise and SMU measurement accuracy
Voltage and current measurement accuracy can be affected by induced RF
field noise strengths greater than 3Vrms in the frequency range of 150 kHz
to 80 MHz.
The extent of this effect depends upon how the instrument is
positioned and shielded.
4- 18
Keysight B1500A User's Guide, Ed ition 14

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