Keysight Technologies B1500A User Manual page 185

Semiconductor device analyzer
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Step delay time: 0 to 1 s, 100 s resolution
Step output trigger delay time: 0 to (delay time) s, 100 s resolution
Step measurement trigger delay time: 0 to 65.535 s, 100 s resolution
Sampling (time domain) measurement
Performs the voltage/current measurement in the specified time interval and plots
the measured data versus time.
Sampling channels: up to 10
Sampling mode: linear or logarithmic (log)
Sampling points: 1 to 100001/(number of channels) for linear sampling, 1 to
1 + (number of data for 11 decades) for log sampling
Sampling interval range: 100 s + 20 s  (number of channels -1) to 2 ms in 10 s
resolution for linear sampling, or 2 ms to 65.535 s in 1 ms resolution for both linear
and log sampling
Hold time, bias hold time: -90 ms to -100 s in 100 s resolution, 0 to 655.35 s in
10 ms resolution
Measurement time resolution: 100 s
Other measurement characteristics
Measurement control:
Single, repeat, append, and stop
SMU setting capabilities:
Limited auto ranging, voltage/current compliance, power compliance, automatic
sweep abort functions, self-test, and self-calibration
Standby mode
If the standby mode is ON, only the standby channels remain programmed to
their specified output value in the non-measurement status.
Bias hold function
This function allows you to keep a source active between measurements. The
source module will apply the specified bias between measurements when
running classic tests inside an application test, in quick test mode, or during a
repeated measurement. The function ceases as soon as these conditions end or
when a measurement that does not use this function is started.
Keysight B1500A User's Guide, Ed ition 14
Specifications
EasyEXPERT Software
4- 45

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