Changes In Revision A.03.60 From Revision A.03.50 - Agilent Technologies E5035A Operation Manual

Hard disk read/write test system
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Manual Changes

Changes in Revision A.03.60 from Revision A.03.50

Changes in Revision A.03.60 from Revision A.03.50
For VEE program, the following measurements have been added and/or modified:
For VEE program, the following parameters have been added and/or modified:
Table A-2
Number of Repetitive Periods
Data Pattern
Overwrite LF
Overwrite HF
LF
HF
Isolated Pulse
The instructions for Auto Alignment Program have been moved to the Service Manual.
Refer to the service manual for details.
370
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SHNR (sub-harmonic noise ratio) measurement has been added. This measurement
allows the user to measure the signal to noise ratio and to detect baseline popping over
various sense current and off-track positions.
The "Optimize" menu in BER Measurement has been modified. This modified version
allows the user to measure the channel quality right after setting up the sequence. Also
the user can select the type of sequence setup, either "Standard Sequence" or "Custom
Sequence" can be selected for optimization.
The parameter "Acceleration" has been added in the [Spinstand] menu. This parameter
allows the user to change the acceleration of the spindle rotation in order to avoid disk
slip.
The minimum 'skew' angle setting in the "Setup" and "Advanced Head Load
Configuration" menu has been increased from -30 to -60 degrees.
The maximum and minimum number of repetitive periods that can be set in the [Pattern
Config] menu for the following data patterns have been modified as follows:
Min.(Old)
4
1
4
1
5
Min.(New)
Max. (Old)
1
20
1
4
1
20
1
4
1
50
Max. (New)
50
50
50
50
50
Appendix A

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