Parametric Measurement (Parametric) - Agilent Technologies E5035A Operation Manual

Hard disk read/write test system
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VEE Measurement Program Operation
Measurement

Parametric Measurement (Parametric)

Overview
This section describes the parametric measurement. Parametric measurement is performed
with TAA, PW and Baseline measurements.
The Parametric measurement measures the following data patterns:
Measurement
1. To open the Parametric menu, click on [Parametric] from the Parametric frame of the
Procedure
Figure 3-30
Parametric Menu
NOTE
Before you execute this measurement, you should set an appropriate input range or execute
the Auto Configuration to set the input range automatically.
2. Set the parameters, click on each button to enter a new value.
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HF pattern for TAA measurement (HF TAA).
LF pattern for TAA measurement (LF TAA).
Isolated Pulse Pattern for TAA measurement (Isolated TAA).
Isolated Pulse Pattern for PW measurement (PW).
HF-TAA and LF-TAA for Resolution computation (Resolution).
Measure menu.
Channel Bit Rate
Write Current
Specifies the speed at which data bits are
written on the media per second [bps].
Specifies the current applied to the write head.
Chapter 3

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