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Manual Changes
Changes in Revision A.03.70 from Revision A.03.60
Changes in Revision A.03.70 from Revision A.03.60
For VEE program, the following measurements have been added and/or modified:
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For VEE program, the following parameters have been added and /or modified:
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Table A-1
Save Trace Parameter
Main Menu
Track Profile
CBR Sweep
RollOff
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[Burst Pattern Write] has been added in the Erase&Write menu. This allows the user to
write multi-burst patterns on the disk which are used as position information for
microactuator test.
[Data Rate Sweep] has been added in the BER's main menu. This measurement adopts
both the channel quality [Ch Quality] and bit error rate [BER] measurement.
The parameter "Endec" has been removed from the BER Measurement menu of BER.
The parameter "Endec" has been removed from the Ch Quality Measurement menu of
BER.
The parameter "Ch Qual. Config" has been added in the Ch Quality Measurement
menu of BER. This parameter depends on each read channel IC.
The parameter "Ch Qual. Config" has been added in the Optimize menu of BER. This
parameter depends on each read channel IC.
The parameter "Save Trace" has been added in the CBR Sweep, RollOff and Track
Profile (except Micro Track and Fast Micro Track) measurement menus as shown in
Table A-1. This allows the user to save swept measurement data in VEE.
Measurement Menu
TAA
Narrow Band TAA
TAA
PW
NLTS 5th Harmonic
Overwrite
Narrow Band TAA
TAA
Narrow Band TAA
Trace Window
TAA Trace
TAA Asym. Trace
PW Trace
PW Asym Trace
TAA Trace
TAA Asym. Trace
Appendix A
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