Test Function; Test Function Control Registers - NEC 78014Y Series User Manual

8-bit single-chip microcontrollers

Table of Contents

18.5 Test Function

In this function, when the watch timer overflows and when a rising edge of port 4 is detected, the corresponding

test input flag is set (1), and a standby release signal is generated.

Unlike the interrupt function, vectored processing not performed.

There are two test input sources as listed in Table 18-5. Basic configuration is shown in Figure 18-17.

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The following three types of registers are used to control the test functions.

• Interrupt request flag register 0H (IF0H)

• Interrupt mask flag register 0H (MK0H)

• Key return mode register (KRM)

CHAPTER 18 INTERRUPT FUNCTIONS AND TEST FUNCTION

Table 18-5. Test Input Source

Test Input Source

Watch timer overflow

Falling edge detection of Port 4

Figure 18-17. Basic Configuration of Test Function

Test Input Signal

MK : Test Mask Flag

Internal/External

Internal Bus

: Test Input Flag

Release Signal