Self Test Error Messages - Agilent Technologies 53147A Assembly Level Service Manual

Chapter 2 Service
Troubleshooting the Instrument

Self Test Error Messages

Table 2-4 lists and describes messages that are generated by the
instrument during Self-Test to indicate whether a component passed or
failed its test. These messages are sent via the RS-232 serial output only—
they do not appear on the instrument's front-panel display.
Table 2-4. Self-Test Messages
Message
ROM TEST FAIL
ROM TEST OK
RAM DATA LINES OK
RAM DATA ERROR
RAM ADDR LINES OK
RAM ADDR ERROR
RAM TEST OK
EEPROM FAIL - CONFIGURATION
DATA
ROM FAIL; Computed checkbyte does
not match the value stored in EEPROM.
EEPROM FAIL - CONFIGURATION
DATA; Needs to be (re)initialized.
EEPROM FAIL - POWER CAL DATA;
Using default data
EEPROM FAIL - SAVED SETTINGS;
Using default data
EEPROM FAIL - SAVED SETTINGS;
Invalid EEPROM SAV n Data.
GPIB FAIL; Conf. Test
Assembly Level Service Guide
Description
ROM failed read test.
ROM passed read test.
RAM data lines passed test.
RAM data lines failed test.
RAM address lines passed test.
RAM address lines failed test.
RAM tests completed with no errors detected.
The configuration data saved in EEPROM
memory is defective.
The checksum of the ROM data does not match
the value stored in EEPROM.
The EEPROM org code does not verify with
current revision of ROM code.
The checksum of the EEPROM power-
calibration table is bad. Factory default
calibration data will be used.
The checksum of the user settings stored in
EEPROM is bad. Factory default settings will
be used.
The checksum of one set of user settings (1 – 9)
stored in EEPROM is bad.
The GPIB hardware failed its confidence test.
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