Connectivity Test - NXP Semiconductors MC13224V User Manual

Mc1322 series simple media access controller demonstration applications
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Chapter 3

Connectivity Test

The connectivity test evaluates the basic connectivity between two transceivers. A transmitter and a
receiver application are required. The connectivity test supports the following functionality:
Configure the transceiver in a specific test mode in order to test the transceiver RF performance.
These test mode are:
— Modulated Transmission
— Unmodulated Transmission
— Pulse PRBS Transmission
— IDLE
Measure the percentage of packet losses over a certain channel as well as the Link Quality Indicator
of each packet received.
Indicate the range of a signal using the Link Quality Indicator.
In both modes parameters such as the channel number and power level can be modified. This allows users
to execute all tests in every channel using different power values.
The application includes a reference oscillator frequency output at a pin useful for frequency measurement
and adjustment when required.
Two possible interfaces are implemented to use this application: a manual interface through push buttons
or menus for a serial interface. Only one interface can be selected, both interfaces can not been working at
the same time. The interface type is selected when creating the project with the Freescale BeeKit.
For manual interface, the function of each button is as follows:
SW1: Selects the application mode. (Channel Change, Power Adjust, Test to perform, etc.) see
Figure
3-1.
SW2: Increases a value.
— For TX the possible options are: IDLE (0), PSRB (1), PER (2), Range Test TX (3), Continuous
Modulated (4) and Continuous Unmodulated (5).
— For RX mode the possible options are: IDLE (0), Continuous reception (1), PER(2) and Range
Test RX (3).
— The values are momentarily shown at the LEDs then LEDs show current application mode.
SW3: To decrease the value.
SW4: To start the test (used only at PER test)
MC1322x SMAC Demonstration Application User's Guide, Rev. 1.3
Freescale Semiconductor
3-1

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