Keithley 4200-SCS User Manual page 75

Semiconductor characterization system
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Model 4200-SCS User's Manual
Figure 2-10
Instrument information, forcing functions, and voltage sweep function parameters
1
Do not change these parameters, unless you want to customize the ITM — which is beyond the scope of this User's manual.
2
Dual sweep – with dual sweep enabled, the SMU will sweep from start to stop, and then sweep from stop back to start. When disabled, the SMU will sweep
from start to stop. For details, see
Figure 2-11
Linear sweep or step, SMU range, Pulse Mode, and SMU current compliance
For a Linear sweep or step Start is the voltage / current at the start
of the sweep, Stop is the voltage / current at the end of the sweep,
and Step is the voltage / current change between steps.
Points — calculated automatically from the Start, Stop, and Step
values — is disabled. For a Log sweep, you specify the Data Points
value. The Step value — calculated automatically — is disabled.
Select the SMU
range to be used
when forcing the
specified voltage
or current. Select
dynamically opti-
mized range
(Auto), single best
range for entire
sweep (Best
Fixed), or manually
specified numeri-
cal range.
3
In a list sweep configuration window, you enter a list of discrete voltages or currents, instead of start, stop, and step values. In a current bias or voltage bias
configuration window, you enter a fixed level value, instead of start, stop, and step values.
4
Pulse mode – Select Pulse Mode to provide pulse output for sweep (linear, log and list) and bias forcing functions. For details, see
on page
2-16.
4200-900-01 Rev. K / February 2017
Select the present forcing
1
function.
Select whether a sweep is
1
linear or logarithmic.
Understanding dual sweep on page
Select the SMU current compliance for a
voltage sweep or the voltage compliance
for a current sweep.
Return to
Select whether a sweep or
step forcing function acts as
a master (independent) or
1
slave (tracks the master).
2
Select Dual Sweep.
2-15.
3
Data
Section Topics
Section 2: Model 4200-SCS Software Environment
Describes the instrument selected for
this device terminal and the mode of the
test being performed. (Sweeping mode
or Sampling mode — in which data is
recorded vs. time for an applied signal).
Select and configure
4
Pulse Mode.
Understanding pulse mode
2-19

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