Vdsid_Pulseiv - Keithley 4200-SCS User Manual

Model 4200-SCS User's Manual
Table 3-6
Return values for cal_pulseiv
Value
0
-13001
-13002
-13003
-13004
-13005
-13006
-13007
-13008
-13009
-13010
-13998
-13999

vdsid_pulseiv

Description
Connection
Table 3-7
Inputs for vdsid_pulseiv
Input
Vgs
Vg_off
VdStart
VdStop
4200-900-01 Rev. K / February 2017
Description
OK
Array Sizes Do Not Match
Arrays Not Large Enough For Data
Invalid Instruments
Unable To Malloc Memory
Unable To Find Delay Between Channels
Scope Measurement Error
Unable To Write To Calibration Files
Invalid Range
Invalid Calibration Type
Calibration Data Does Not Meet
Correlation Specification
Calibration Constant Error
Divider Cal Error
The vdsid_pulse sweep is used to perform a pulsed Vd-Id sweep using the 4200-
PIV package. This test is similar to a typical DC Vd-Id but only two sources are
used: gate (VPUID pulse channel 1) and drain (DrainSMU). The gate is pulsed,
but the drain is DC biased.
Measurements are made with the two channel scope card. To create a family of Vd-
Id curves, change Vgs and run the test by using the append button. Make sure to
set the appropriate values for the Vds-Id parameters (see
Table 3-8 contain outputs and return values, respectively.
The source and body (well) of the DUT must be shorted together and connected to
the common low (outer shield) of the SMA cables on the AC+DC output of the
4200-RBT. The RBT connected to GateSMU (with the power divider) should be
connected to the gate. The RBT connected to DrainSMU should be connected to
the drain. For detailed connection information, refer to the
assembly procedure on page
Type Description
double The pulsed gate-source voltage bias, output by channel 1 of the pulse
generator card (VPUID).
double The DC bias applied by the GateSMU to put device in the OFF
state. Normally set to 0 V for enhancement FETs (may be non-zero for
depletion FETs).
double The starting sweep value for Vd, output by the DrainSMU (defined
below).
double The final sweep value for Vd, output by the DrainSMU (defined below).
Return to Section Topics
Section 3: Common Device Characterization Tests
3-35.
Table 3-7). Table 3-8 and
PIV-A interconnect
3-51