Probers; Advanced Connections; Testing With More Than ±20 V - Keithley 4200-SCS User Manual

Semiconductor characterization system
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Model 4200-SCS User's Manual
NOTE
Testing with more than ±20 V
If voltages greater than ±20 V are required for testing, follow these steps:
NOTE
For more details about the 4200-SCS interlock system, see the
data connections, page
CAUTION

Probers

To learn how probe stations are controlled by 4200-SCS through user modules, refer to the
Reference Manual, Using a Probe Station, Appendix

Advanced connections

To learn more about advanced connections for controlling a switch matrix, sequencing test on
multiple devices, and customizing a user test module (UTM) refer to the
Advanced Applications, Appendix
4200-900-01 Rev. K / February 2017
The 4200-SCS will function on all current ranges and up to ±20 V without the
interlock being asserted. The maximum voltage on the SMU and preamp terminals is
not hazardous when the interlock is not asserted.
Ensure that hazardous voltages are not present when the fixture's exterior enclosure is
open.
The 4200-SCS voltage output will be higher when the fixture's exterior enclosure is
closed.
Add an interlock switch to the fixture.
Connect the exterior enclosure to COMMON or safety ground using #18AWG wire or
greater.
Ensure that the wiring (FORCE, GUARD, and SENSE) within the fixture does not contact
the exterior enclosure.
4-20.
Asserting the interlock will allow the SMU and preamp terminals to
become hazardous, possibly exposing the user to high-voltage that could
result in personal injury or death.
SMU and preamp terminals should be considered hazardous even if the
outputs are programmed to be low voltage.
Precautions must be taken to prevent a shock hazard by surrounding the
test device and any unprotected leads (wiring) with double insulation for
250 V, Category I.
Return to
G.
O.
Section Topics
Section 1: Getting Started
Reference Manual, Control and
Reference Manual,
1-37

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