Pgu-Trigger Test; Pgu1-Setup Test; Second Id-Vg Test - Keithley 4200-SCS User Manual

Section 4: How to Control Other Instruments with the Model 4200-SCS

pgu1-setup test

In the project navigator, double-click pgu1-setup to open the test. The complete parameter listing
for the test is shown in
description area of the definition tab.
Figure 4-52
Figure 4-52
PGU stress pulse specifications
NOTE

pgu-trigger test

In the project navigator, double-click pgu-trigger to open the test. The two-line parameter list for
this test is shown in
N-channel MOSFET.
Figure 4-53
pgu-trigger test: Trigger the burst of stress pulses
Third connect test
This connect test is the same as the first connect test. It connects the device to the SMUs so that
the transfer characteristics can be determined after applying the pulse stress (see
Figure 4-48).

Second id-vg test

This id-vg test is the same as the first id-vg test. It measures the transfer characteristics of the
N-channel MOSFET. This is the after-stress characterization test.
4-34
Figure 4-52. These parameters to configure the PGU are explained in the
shows the pulse that is configured by this test.
µ
The pulse is not drawn to scale.
Figure 4-53. This test triggers the PGU to output 60,000 pulses to the
Return to
µ
Triggers burst of pulses
Section Topics
Model 4200-SCS User Manual
Figure 4-47
4200-900-01 Rev. K / February 2017
and