Configuring The Subsite Setup Tab; Step A: Enable Cycling; Step B: Choose The Mode Of Cycling; Step C1: Specify Cycle Timing; Linear, Log Or List (Stress / Measure Mode Only) - Keithley 4200-SCS User Manual

Semiconductor characterization system
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Section 3: Common Device Characterization Tests

Configuring the Subsite Setup tab

To set up cyclical testing, configure the Subsite Setup tab as shown in steps A
through E below.

Step A: Enable cycling

Figure 3-52
Enabling cycling

Step B: Choose the mode of cycling

Figure 3-53
Specifying the mode of cycling (Stress / Measure Mode or Cycle Mode)
Test
Stress
Test ... cycles.
For example, Hot Carrier Injection
(HCI) or Negative Bias Temperature
Instability (NBTI) studies.
NOTE

Step C1: Specify cycle timing; linear, log or list (stress / measure mode only)

Figure 3-54
3-55
explains how to set timing for the list mode.
3-70
What are your test
Test
Stress
In order to use the switching feature of 4225-RPMs during the transition from
measure to stress, ensure that the instruments connected to the RPMs are
configured in KCON (see
Configuration, page
7-9).
explains how to set timing for the linear and log modes, while
Return to
Only repetitive
cycling through
subsite tests:
no stressing of
devices
Reference manual, Tools > Update DC Preamp and RPM
Section Topics
Model 4200-SCS User's Manual
Note that cycling
cannot be configured
until it is enabled
4200-900-01 Rev. K / February 2017
Figure

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