Vdid_Pulse_Dc_Family_Pulseiv - Keithley 4200-SCS User Manual

Model 4200-SCS User's Manual
Table 3-9
Return values for vdsid_pulseiv
Value
0
-1
-2
-3
-4
-5
-6
-7
-8
-9
-10
-11
-12
-13
-14

VdId_Pulse_DC_Family_pulseiv

Description
Connection
4200-900-01 Rev. K / February 2017
Description
OK
Invalid value for Vgs
Invalid value for VdStart
Invalid value for VdStop
Invalid value for VdStep
Invalid value for PulseWidth
Invalid value for PulsePeriod
Invalid value for AverageNum
Invalid value for LoadLineCorr
Array sizes do not match
Array sizes not large enough for sweep
Invalid VPUId
Invalid GateSMU
Invalid DrainSMU
Unable to initialize PIV solution
The VdId_Pulse_DC_Family_pulseiv sweep is used to perform a Pulsed vs DC
Vd-Id sweep using the 4200-PIV-A package. This test is similar to a typical Vd-Id
but only two sources are used: one for the DUT Gate and one for the DUT Drain.
Pulsed Measurements are made with the 2-channel scope, 4200-SCP2.
To create a family of curves, choose an appropriate start and stop value for Vgs,
and a number of steps.
This routine can run the sweeps in three different ways: 1) DC only; 2) Pulse only;
3) Pulse and DC curves. This routine supports from one to 10 Vd-Id curves based
on up to 10 different Vgs values.
This routine also supports the 4200-PIV-A package using the 4200-RBT. For this
package, all test parameters and limits are given below, except the 4200-PIV-A
with the 4200-RBT has a max pulse width of 150 ns, not the 250 ns of the
4205-RBT.
All voltage levels specified below assume a 50 Ω DUT load.
The source and body (well) of the DUT must be shorted together and connected to
the common low (outer shield) of the SMA cables on the AC+DC output of the
4205-RBT. The RBT connected to GateSMU (the RBT with the Power Divider)
should be connected to the gate. The RBT connected to DrainSMU should be con-
nected to the drain. Use either G-S-G probes for RF structures, or use DC probes
with the 4200-PRB-C adapter cables for DC structures.
Return to Section Topics
Section 3: Common Device Characterization Tests
3-53