Keithley 4200-SCS User Manual page 194

Section 3: Common Device Characterization Tests
1. Select Enable Cycles.
2. Select the Segment Stress / Measure Mode.
3. Select and configure Stress / Measure Cycle Times:
If needed, specify a Stress / Measure Delay. This allows the device to settle after stressing
before performing the DC measurements.
4. Periodic testing is not available for the Segment Stress / Measure Mode.
5. Clicking the Apply button updates the settings in the Subsite Setup tab. The button will be
inactive if updating is not required.
6. Click Device Stress Properties to open the window to configure the Segment ARB
waveform, SMU bias levels and matrix connections (see
Device Stress Properties on page 3-89
Figure 3-70
Segment stress / measure mode: Log and list cycle counts
3-88
Linear cycle counts: After setting the first and total stress counts, and the number of
stresses, the linear Stress Counts will be automatically
calculated and displayed when Apply is clicked (Step 5). The
Number of Stresses must be less than the Total Stress Count, or
an error will be displayed. Note that the Total Stress Count is
cumulative.
Log cycle counts:
After setting the first and total stress counts, and the number of
stresses per decade, the log Stress Counts is automatically
calculated and displayed when Apply is clicked (step 5) (see
Figure
Cycle counts are added to the Cycle Times list by entering a
List cycle counts:
count value into the Stress Counts field and clicking Add. A
cycle count value can be removed by selecting it and clicking
Remove (see
cumulative.
Log cycle
Return to
3-70). Note that the Total Stress Count is cumulative.
Figure 3-70). Note that the Total Stress Count is
to continue the configuration process.
List cycle
Section Topics
Model 4200-SCS User's Manual
Figure 3-71). Proceed to
4200-900-01 Rev. K / February 2017
®
Configure