Keithley 4200-SCS User Manual page 190

Semiconductor characterization system
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Section 3: Common Device Characterization Tests
Figure 3-66
Example of "First Stress Only" measurement
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10.00
Device selection
The Device Stress Properties window corresponds to the selected device in the
Subsite Plan. The individual properties window for the each device is selected
using the Next Device or Prev Device buttons. If there is only one device in the
Subsite Plan, these buttons will be disabled.
Leave stress conditions on
DC stressing only: Enable the Leave Stress Conditions On button to leave the
outputs of the SMUs on after the end of a stress cycle.This allows the stress to
continue until the next test is performed in the project tree. You may want to keep
stress on as long as possible so the DUT doesn't have time to relax before the
tests are performed.
Clear, copy, paste, and paste to all sites
Clear: Clicking the Clear button clears all stress properties data for the displayed
device. It sets all voltage and current values to zero, sets device pin number
assignments to zero, sets Stress Measurements to Do Not Measure, and disables
all Targets (clears Target Values).
Copy and Paste: Copy and Paste allow properties settings for one device to be
copied and pasted into the properties window for a different device. It can also be
used to copy and paste settings into a different site.
3-84
41.8017E-10
Return to
Drop-down menus to control Stress Measurements.
Do Not Measure: Do not Make the specified
measurement.
First Stress Only: Take the specified measurement
on the first stress cycle only.
Every Stress Cycle: Take the specified measurement
on every stress cycle.
Example of First Stress Only measurement (I Drain)
Section Topics
Model 4200-SCS User's Manual
4200-900-01 Rev. K / February 2017

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