Cvu Frequency Sweep (Bias) - Keithley 4200-SCS User Manual

Semiconductor characterization system
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Section 3: Common Device Characterization Tests
3.
After the built-in system delay and programmed delay, the 4210-CVU makes a
measurement. The AC test signal is applied just before the start of the measurement. AC
drive is turned off after the measurement is completed.
4.
Steps 2 and 3 are repeated for the -2 V, 3 V and -4 V DC bias voltages. The hold time delay
repeats at the beginning of each subsequent step.
The sweep delay, hold time and output disable are set from the
window for sweeping.
Figure 3-20
CVU Voltage List Sweep output
3V
PreSoak 2V
1V
0V
Run
Test
-2V
-4V

CVU Frequency Sweep (bias)

Figure 3-21
(bias) selected as the forcing function to measure Cp-Gp. The Sweeping test
mode must be selected for this test (see
3-24
HT
Delay
Meas
SD
SD
shows an example of a FFMO window with CVU Frequency Sweep
Return to
SD
Delay
Meas
Delay
Meas
Figure
Section Topics
Model 4200-SCS User's Manual
ITM timing
AC Voltage
15mV RMS
Frequency = 100kHz
Disable outputs
at completion
enabled
SD
Delay
Meas
3-11).
4200-900-01 Rev. K / February 2017

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