How To Perform A Pulsed I-V Test On My Device; Introduction (Piv-A And Piv-Q) - Keithley 4200-SCS User Manual

Model 4200-SCS User's Manual
Figure 3-24
CVU Frequency Sweep (step) output
PreSoak

How to perform a Pulsed I-V test on my device

There are a few ways to perform Pulse I-V testing with the 4200-SCS. One
method uses the 4225-PMU with or without the 4225-RPM. The PMU is an
integrated solution, with two channels of voltage pulsing and integrated
simultaneous voltage and current sampling. See
Manual for more information on the PMU, RPM, and how to test using these
instruments.
There are also pulse packages (4200-PIV-A and 4200-PIV-Q) that use individual
pulse and scope instruments and are described below. These packages use
different hardware and are not compatible with the PMU or RPM.

Introduction (PIV-A and PIV-Q)

Pulse I-V is used in addition to DC IV test results to address two DUT behaviors:
self heating (also called joule heating) and transient charging. For RF Transistors,
especially those implemented with compound semiconductor materials, these two
effects are called dispersion. The self heating and charging effects cause the DC
and Pulse I-V responses to differ.
Pulse I-V addresses self heating by permitting the use of a low duty cycle, <0.1 %,
pulses to virtually eliminate heating within the DUT. Pulse I-V addresses the
charging effects by using pulse widths short enough so that charges cannot be
sufficiently mobile within the pulse.
4200-900-01 Rev. K / February 2017
Stop 2V
1V
100kHz 200kHz
Start
0V
Run
HT SD Del Msr
Test
-1V
Return to
100kHz 200kHz
Step
SD Del Msr
1V
SD Del Msr
AC Voltage = 15mVRMS
Section Topics
Section 3: Common Device Characterization Tests
100kHz
200kHz
Step
Msr
SD Del
1V
SD Del Msr
HT = Hold Time
SD = Built-In System Delay
Del = Programmed Delay
Msr = Measure Time
Section 16 of the Reference
Msr
SD Del
Disable outputs
at completion
enabled
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