Iiss <--> Dadf Communication Failure; Platen Cover Open - Panasonic DP-C321 Service Handbook

3-30
006-277 IISS <--> DADF COMMUNICATION
FAILURE
Description Communication cannot be established between
the IIT/IPS and the DADF Control PWB.
BSD on : CH5.2 CH5.7
Procedure
Turn On the power. Does the CR4 on the DADF CONTROL
PWB light?
Y N
Is +5 VDC measured between the DADF CONTROL
PWB J550-6 (+) and GND (-)?
Y N
Check the +5 VDC circuit to the DADF CONTROL
PWB J550-6 by referring to Chapter 4 Wiring
Data.(WN4.3.27 DADF+5 VDC)
Replace the DADF CONTROL PWB (PL18.3).
Turn Off the power. Check conductivity of the following:
Between IIT/IPS PWB J725-20 and DADF CONTROL
PWB J551-A1
Between IIT/IPS PWB J725-19 and DADF CONTROL
PWB J551-A2
Between IIT/IPS PWB J725-18 and DADF CONTROL
PWB J551-A3
Between IIT/IPS PWB J725-17 and DADF CONTROL
PWB J551-A4
Is the resistance 1 Ohm or less for all wires?
Y N
Check wires with more than 1 Ohm for an open circuit or
poor contact.
Replace the following parts:
DADF CONTROL PWB (PL18.3)
IIT/IPS PWB (PL16.3)

006-300 PLATEN COVER OPEN

Description The PLATEN COVER was opened during the
ADF Job.
BSD on : CH6.3 CH6.12A
Procedure
Enter DC330 [006-300] and turn it On.
Bring the magnet directly near to the PLATEN OPEN
SWITCH.
Is the display switched to "H"?
Y N
Remove the TOP COVER while it is On. P/J736 Remove
the P736. Cheat P736 Pin 1 and Pin 2. Is the display
switched to "H"?
Y N
Check the wire between the PLATEN OPEN
SWITCH P736-1 and the IIT/IPS PWB J722-A1, and
the wire between the PLATEN OPEN SWITCH
P736-2 and the IIT/IPS PWB J722-A1 for an open
circuit or poor contact.
If no problems are found, replace the IIT/IPS PWB.
(PL16.3)
Replace the PLATEN OPEN SWITCH (PL16.4)
Enter DC330 [005-102] and turn it On.
Turn the DADF DOCUMENT SENSOR On/Off using a sheet
of paper, etc.
Is the display switched between H and L?
Y N
Repair the DADF DOCUMENT SENSOR using 3.3.3.2
Generic Permeable Sensor Failure FIP.
Check that the DADF Magnet (directly on top of the PLATEN
OPEN SWITCH) is disengaged. Check that the DADF height
is correct. (ADJ3.2.3)
Chapter 3 Troubleshooting
006-312 IIT MEMORY HOT LINE FAILURE
Description The system detected the IIT MEMORY HOT
LINE being an open circuit.
BSD on : CH6.2 CH6.12B
Main Causes
• Poor contact of the IIT/IPS PWB
• IIT/IPS PWB failure (PL16.3)
006-340 IISS RAM TEST ERROR
Description At POWER On, the system detected a IIT/IPS
PWB RAM test error.
BSD on : CH3.1B CH3.6B
Procedure
• If the problem persists after turning the power On/Off,
replace the IIT/IPS PWB. (PL16.3)
006-345 IISS EEPROM FAILURE
Description
1. The NVM value cannot be written at the IIT/IPS PWB
Write.
2. A communication failure with the EEP-ROM was
detected.
BSD on : CH3.1B CH3.6B
Procedure
• If the problem persists after turning the power Off/On,
replace the IIT/IPS PWB. (PL16.3)