Tdo (Test Data Output) - AMD K5 Technical Reference Manual

18524C/0—Nov1996
5.2.52

TDO (Test Data Output)

Summary
Driven and Floated
Details
Signal Descriptions
Output
TDO carries output data for testing on the Test Access Port
(TAP).
The processor drives TDO every falling TCK edge, but only
during the shift_IR and shift_DR states. It is floated at all other
times.
TDO is always driven, except when floated and while RESET
or INIT is asserted.
Instructions are shifted out of the processor on TDO during the
shift_IR TAP state. Data are shifted out of the processor on
TDO during the shift_DR TAP state.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE 1149.1) specification for a description of
how the TAP signals and instructions are used for testing.
AMD-K5 Processor Technical Reference Manual
5-129