Lenovo ThinkServer RD650 User Manual page 364

12Gb/s MegaRAID SAS Software User Guide
March 2014
Number
0x00cf Information
0x00d0 Information
0x00d1 Information
0x00d2 Information
0x00d3 Critical
0x00d4 Information
0x00d5 Information
0x00d6 Critical
0x00d7 Information
0x00d8 Critical
0x00d9 Information
0x00da Information
0x00db Information
0x00dc Information
0x00dd Warning
0x00de Warning
0x00df Warning
0x00e0 Information
0x00e1 Warning
0x00e2 Warning
0x00e3 Information
0x00e4 Warning
0x00e5 Information
0x00e6 Information
0x00e7 Information
0x00e8 Information
0x00e9 Information
Severity
Event Text
Level
Enclosure %s Power supply %d cable
inserted
Enclosure %s Fan %d returned to
normal
BBU Retention test was initiated on
previous boot
BBU Retention test passed
BBU Retention test failed!
NVRAM Retention test was initiated
on previous boot
NVRAM Retention test passed
NVRAM Retention test failed!
%s test completed %d passes
successfully
%s test FAILED on %d pass. Fail data:
errorOffset=%x goodData=%x
badData=%x
Self check diagnostics completed
Foreign Configuration detected
Foreign Configuration imported
Foreign Configuration cleared
NVRAM is corrupt; reinitializing
NVRAM mismatch occurred
SAS wide port %d lost link on PHY
%d
SAS wide port %d restored link on
PHY %d
SAS port %d, PHY %d has exceeded
the allowed error rate
Bad block reassigned on %s at %lx to
%lx
Controller Hot Plug detected
Enclosure %s temperature sensor %d
differential detected
Drive test cannot start. No qualifying
drives found
Time duration provided by host is
not sufficient for self check
Marked Missing for %s on drive
group %d row %d
Replaced Missing as %s on drive
group %d row %d
Enclosure %s Temperature %d
returned to normal
Generic Conditions when Each Event Occurs
Logged when the enclosure services process has detected
that the Enclosure Power supply cable is inserted and it was
removed earlier.
Logged when the enclosure services process has detected
that the current status of a fan is good and it was failed
earlier.
Logged when the Battery Retention test was initiated on
previous boot.
Logged when the Battery Retention test passed successfully.
Logged when the Battery Retention test failed.
Logged when the NVRAM Retention test was initiated on
previous boot.
Logged when the NVRAM Retention test passed successfully.
Logged when the NVRAM Retention test failed.
Logged when the controller diagnostics test passes
successfully.
Logged when the controller diagnostics test fails.
Logged when Self check diagnostics is completed.
Logged when Foreign Configuration is detected.
Logged when Foreign Configuration is imported.
Logged when Foreign Configuration is cleared.
Logged when NVRAM is corrupt and re-initialized.
Logged when NVRAM mismatch occurs.
Logged when SAS wide port lost link on a PHY.
Logged when a SAS wide port restored link on a PHY.
Logged when a SAS PHY on port has exceeded the allowed
error rate.
Logged when a Bad block is reassigned on a drive from a
error sector to a new sector.
Logged when a Controller Hot Plug is detected.
Logged when an Enclosure temperature sensor differential is
detected.
Logged when Disk test cannot start. No qualifying disks
found.
Logged when Time duration provided by the host is not
sufficient for self check.
Logged when a physical drive is Marked Missing on an array
at a particular row.
Logged when a physical drive is Replaced Missing on an array
at a particular row.
Logged when an Enclosure temperature returns to normal.
LSI Corporation
- 364 -
Appendix A: Events and Messages