Ricoh FT6645 Manual page 36

23 April 1993
3. V and V corrections
D L
Using the calculated V
developed again and the new V
If both V and V
D
and development bias (V
and V values.
R
Specifications:
V = –770 + V
D
V = –140 + V
L
If V is outside specifications, V
D
is measured again and V
The same is done for V
The above process continues until both V
The graph on the previous page shows the example when only V
outside specifications at the first V
specifications after one V
changed 20V/step).
If V or V at drum potential sensor calibration is outside specifications or
100 800
if V or V do not fall within specifications after V
D L
the maximum or minimum level, the machine stops V
uses the previous V
In this case, nothing is indicated on the machine but the SC counter is
incremented.
Related SC codes (see troubleshooting section for details):
Code
361
364
365
Development bias is also decided by using V
V = V + (–220)
BB R
4. ID sensor pattern potential detection
This is performed to determine ID Sensor Bias Voltage. The details are
explained in the development control section (see page 2-16).
and V
GRID
, V
R
data are within specifications, the new V
L
) are determined based on the new V
BB
± 20 V
R
± 20 V
R
GRID
is detected again.
D
and V .
L LAMP
detection and it became within
L
correction (V
L
and V values during copying.
GRID LAMP
Incomplete drum potential sensor
calibration
Abnormal V
Abnormal V
data, V , V
LAMP R
, and V data are detected.
D L
is shifted one step. Then the V
and V fall within specifications.
D L
is changed 0.5V/step , V
LAMP
or V
GRID
D
Condition
detection
D
detection
L
as follows.
R
2-11
PROCESS CONTROL
and V patterns are
D, L
, V
GRID LAMP
, V
D
pattern
D
was
L
GRID
are shifted to
LAMP
or V correction and
L
,
L
is