HP 8712ES User Manual page 4

Rf network analyzers
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Introducing the Analyzer
The HP 8712ES and HP 8714ES are easy-to-use RF network analyzers
optimized for production measurements of S-parameters. The
instrument integrates an RF synthesized source, S-parameter test set,
multi-mode receivers, and display in one compact box.
The source features 1 Hz resolution, 40 ms (or faster) sweep time, and up
to +13 dBm output power.
S-parameter test sets provide the capability to measure reflection and
transmission characteristics of two-port devices in either the forward or
reverse direction with a single connection. RF power can come out of
either the analyzer's port 1 or port 2, and either port can be connected to
a receiver. S-parameter test sets also allow full two-port (12 term) error
correction, which is the most accurate form available.
The three-channel, dual mode receivers provide dynamic range of
greater than 100 dB in narrowband measurement mode. For
measurements of frequency-translating devices, the network analyzer
features broadband internal detectors and external detector inputs. The
receivers incorporate digital signal processing and microprocessor
control to speed operation and measurement throughput.
Two independent measurement channels and a large display show the
measured results of one or two receiver channels in several
user-selectable formats. An external VGA monitor can be connected to
the rear panel for enhanced measurement viewing in color.
Measurement functions are selected with front panel hardkey and
softkey menus. Measurements can be printed or plotted directly with a
compatible peripheral. Instrument states can be saved to the internal
floppy disk, internal non-volatile memory, or internal volatile memory.
Built-in service diagnostics are available to simplify troubleshooting
procedures
Measurement calibrations and data averaging provide performance
improvement and flexibility. Measurement calibrations consist of
normalizing data, utilizing the internal factory calibration, or calibrating
with external standards. Measurement calibration reduces errors
iv
ES User's Guide

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