Using Limit Testing - HP 8712ES User Manual

NOTE
NOTE
Using Instrument Functions

Using Limit Testing

Using Limit Testing
Limit testing is a measurement technique that compares measurement
data to constraints that you define. Depending on the results of this
comparison, the analyzer can indicate if your device either passes or fails
the test.
Limit testing is useful for real-time tuning of devices to specifications.
When limit testing is turned on, pass/fail results can be output to the
display and also to the LIMIT TEST TTL IN/OUT connector on the rear
panel. See "Analyzer Connectors—Rear Panel BNC Connectors" on
page 7-4 for more information.
Limit testing is implemented by creating individual flat, sloping, or
single point limits on the analyzer display. These types of lines may be
used individually or combined to represent the performance parameters
for your device under test. Also available are limit testing capabilities for
five types of marker searches: statistical mean, peak-to-peak ripple,
flatness, delta amplitude, and delta frequency.
Limit testing is only performed on the measurement data trace. It cannot
be performed on a memory trace.
Limit line testing is not available when the analyzer is in Smith chart or
polar format. If limit lines are on and you change to Smith chart or polar
format, the analyzer will automatically turn off the limit line(s).
The following examples are performed using an S
transmission measurement of the bandpass filter shipped with your
instrument. To follow along with these examples, connect your filter to
the analyzer and press:
PRESET
( User Preset or
Center
FREQ
Span MHz
200
Enter
SCALE 5
Reference Level
4-28
Factory Preset )
MHz
175
−15
Enter
forward
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ES User's Guide