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System Hardware
Overview
Agilent B1542A Pulsed IV Package expands the capabilities of Agilent B1500A
Semiconductor Device Analyzer to enable the ultra short pulsed IV measurements
with parametric characterization down to 10 ns pulse width for many new device
structures such as silicon-on-insulator (SOI) transistors that are more susceptible to
harmful thermal effects during characterization.
Using the B1542A, you can easily and effectively configure the pulsed IV test
system and perform the pulsed IV measurement of MOSFET on the Agilent
EasyEXPERT or Desktop EasyEXPERT application test environment.
The B1542A supports the B1500A as the DC source monitor. And the option
B1542A-003 additionally supports the Agilent 4155B/4155C/4156B/4156C
Semiconductor Parameter Analyzer and the Agilent E5260/E5270 Series of
Parametric Measurement Solutions by using the Desktop EasyEXPERT software.
The pulsed IV test system can be configured by using the following equipment. See
Figure 1-1. The B1542A provides the accessories used to connect the equipment.
•
Agilent B1500A Semiconductor Device Analyzer, see Table 1-1
•
Pulse Generator, minimum one output channel, see Table 1-2
•
Oscilloscope, minimum two measurement channels, see Table 1-3
•
Agilent 11713A Switch Controller and Pulse/dc Switch Units, optional
Option B1542A-024 or equivalent. For the DC + pulsed IV test system.
•
Windows PC installed with Desktop EasyEXPERT
Optional for the system with the B1500A. Absolute necessity for the system
with the option B1542A-003.
With the option B1542A-003, the following instruments can be used as the DC
source monitor instead of the B1500A. Also see Table 1-1.
•
Agilent 4155B/C Semiconductor Device Analyzer
•
Agilent 4156B/C Precision Semiconductor Device Analyzer
•
Agilent E5260A/E5270B Measurement Mainframe
•
Agilent E5262A/E5263A 2 Channel Source/Monitor Unit (not available for the
DC + pulsed IV test system or the option E1542A-024)
Agilent B1542A User's Guide, Edition 4
Introduction
Overview
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