STMicroelectronics STM32L162RC Manual page 99

STM32L162VC, STM32L162RC
Symbol Parameter
Offset error temperature
(1)
dOffset/dT
coefficient (code 0x800)
(1)
Gain Gain error
Gain error temperature
(1)
dGain/dT
coefficient
(1)
TUE Total unadjusted error
Settling time (full scale:
for a 12-bit code
transition between the
t lowest and the highest
SETTLING
input codes till
DAC_OUT reaches final
value ±1LSB
Max frequency for a
correct DAC_OUT
change (95% of final
Update rate
value) with 1 LSB
variation in the input
code
Wakeup time from off
state (setting the ENx bit
t
WAKEUP
in the DAC Control
(8)
register)
V supply rejection
DDA
PSRR+ ratio (static DC
measurement)
1. Data based on characterization results.
2. Connected between DAC_OUT and V
3. Difference between two consecutive codes - 1 LSB.
Table 59. DAC characteristics (continued)
V = 3.3V
DDA
V = 3.0V
REF+
T = 0 to 50 ° C
A
DAC output buffer OFF
= 3.3V
V
DDA
V = 3.0V
REF+
T = 0 to 50 ° C
A
DAC output buffer ON
≤ 50 pF, R
C
L
DAC output buffer ON
(7)
No R , C
L
DAC output buffer OFF
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer OFF
= 3.3V
V
DDA
= 3.0V
V
REF+
= 0 to 50 ° C
T
A
DAC output buffer ON
≤ 50 pF, R
C
L
DAC output buffer ON
No R , C
L
DAC output buffer OFF
C ≤ 50 pF, R
L
≤ 50 pF, R
C
L
≤ 50 pF, R
C
L
≤ 50 pF, R
C
L
.
SSA
DocID022881 Rev 10
Conditions Min
-20
≥ 5 kΩ
L
≤ 50 pF
L
-10
-40
≥ 5 kΩ
L
≤ 50 pF
L
≥ 5 kΩ
L
≥ 5 kΩ
L
≥ 5 kΩ
L
≥ 5 kΩ
L
Typ Max
-10
0 20
- +0.1 / -0.2% +0.2 / -0.5%
- +0 / -0.2% +0 / -0.4%
-2
-8
- 12
- 8
- 7
- -
- 9
- -60
Unit
0
µV/°C
50
%
0
µV/°C
0
30
LSB
12
12 µs
1 Msps
15 µs
-35 dB
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