Toshiba GR200 Series Instruction Manual page 1536

Setting
Setting of TEST (Function ID: 201301)
Setting items
TestFlag-EN
A.M.F.
Setting of CMMSLV (Function ID: 300001)
Setting items
S-TestFlagCancel
GOSNDBLK
GOSUBBLK
Setting for Protection function test
Setting items
CLP-Test
Local-Test
Loop-Test
Open 1
Open 2
DIFL-STUB-Test
ZS-Test.CTRL
ZS-Offset.CTRL
ZS-Test.XAngle
ZG-Test.XAngle
THM-Test
THM-IP
SOTF-Test
UV-Test
UVS-Test
SHOTNUM-Test
SYNC01-Test
SYNC02-Test
Setting of BIO_FORCE (Function ID: 240101)
Setting items
SLOT*-BIxx-SET
SLOT*-BOxx-SET
Range
Unit
Off / On – Change test flag on Protocol
Off / On Supervisor function use or not
Range
Unit
Off / On Cancelling test flag of slave communication
Off / On GOOSE publishing block
Off / On GOOSE subscription block
Range
Unit
1A rated 5A rated
Off / STATE0 / STATE3 Forcibly changing to CLP state
Off / On Local Test Switch
Off / On External Loop Test Switch
Off / On CH1 Open Test Switch
Off / On CH2 Open Test Switch
Off / On Forcibly establishing the stub condition
Off / On ZS-test mode use or not use
Normal / Offset / Non-
ZS-offset mho use or not use
Offset
Off / On ZS-reactance test mode use or not use
Off / On ZG-reactance test mode use or not use
Off / On To utilize the setting[THM-IP]
0.00 -1.00 0.00 -5.00 Previous load current for thermal testing
Off / On Forcibly establishing the cold load condition
Off / On Not to execute UV block function
Off / On Not to execute UVS block function
Off / S1 / S2 / S3 / S4 / S5
Auto reclose test shot number
/ S6
Off / On SYNC DEV1 synchronism check test mode
Off / On SYNC DEV2 synchronism check test mode
Range
Unit
Normal / Off / On Test switch for BI circuit xx at slot "IO#*"
Normal / Off / On Test switch for BO circuit xx at slot "IO#*"
- 1513 -
6F2S1914 (0.49)
Contents
Contents
Contents
Contents
GRL200 (Soft 033 & 037)
Default
Note
On
On
Default
Note
Off
Off
Off
Default
Note
Off
Off
Off
Off
Off
Off
Off
Normal
Off
Off
Off
0.00
Off
Off
Off
Off
Off
Off
Default
Note
Normal
Normal