Toshiba GR200 Series Instruction Manual page 1173

Abbreviations
X a , X b , X c , X ab , X bc , X ca
CH1 Delay, CH2 Delay (3)
CH1 DT, CH2 DT (3)
Note: Terms 'I 0 (i.e., 3I 0 )' and 'V 0 (i.e., 3V 0 )' are calculated using three-phase quantities.
1
Note: The 'I e ' and 'I em ' are obtained usually with corresponding 'I e ' and 'I em ' circuits in
2
the VCT.
Note: 'CH2' is available when two signaling modules exist in the IED, which is
3
dependent on the hardware. Check the ordering number at the C position
referring to the ordering (See
Screen information
8.1.2
Figure 8.1-1 illustrates the information displayed on the IED screen†, which can display up to
eight fault records (#1 to #8). Figure 8.1-2 illustrates the structure of the first fault record#1.
The line○ indicates the tripped phase. The lines○
c
have the information about evolving faults, which is able to memory up to 32 developing faults.
Quantitates when the fault occurred are shown below messages○
Fault Record
10:48
#1
10:48:21.223
#2
01:15:55.018
#3
13:11:29.621
List of fault records (#1 to #8)
Figure 8.1-1 Information of the fault recorder displayed on the IED screen
†Note: For more screen information, see Chapter
more information about the FL calculation, see Chapter
end fault locator
Displayed quantities
Propagation delay times at port1(CH1) and port2(CH2)
Sampling difference between terminals at port1(CH1) and port2(CH2)
1/6
2012-07-25 >
2012-07-21 >
2012/07/21 >
.
- 1150 -
Appendix: Ordering )
show how tripping occurred. The lines○
d
Fault Record#1
10:48
2012-07-25
10:48:21.223
Phase AB
OC1, OC2, OC3, OC4
SOTF–OC
FL 0.0km
Details of #1 information
User interface: Record sub-menu
6F2S1914 (0.49)
.
○
g h
1/222
. For
Relay application: Single-
GRL200 (Soft 033 & 037)
f