Temperature Sensor; Vref - Texas Instruments MSPM0G350 Series Manual

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7.12.4 Typical Connection Diagram
1. Refer to ADC Electrical Characteristics
2. Refer to Digital IO Electrical Characteristics
3. C and R represent the parasitic capacitance and resistance of the external ADC input circuitry
par par
Use the following equations to solve for the minimum sampling time (T) required for an ADC conversion:
1. Tau = (R + R ) × C
par in
n
2. K= ln(2 /Settling error) – ln((C
3. T (Min sampling time) = K × Tau

7.13 Temperature Sensor

over operating free-air temperature range (unless otherwise noted)
PARAMETER
TS Factory trim temperature
TRIM
TS Temperature coefficient
c
t Temperature sensor settling time
SET, TS
(1) Higher absolute accuracy may be achieved through user calibration. Please refer to temperature sensor chapter in detailed description
section.
(2) This is the minimum required ADC sampling time when measuring the temperature sensor.

7.14 VREF

7.14.1 Voltage Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
Minimum supply voltage needed for
VDD
min
VREF operation
VREF Voltage reference output voltage
7.14.2 Electrical Characteristics
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
I VREF operating supply current
VREF
I VREF output drive strength
Drive
I VREF short circuit current
SC
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Device
Boundary
V
in
C
par
Figure 7-4. ADC Input Network
for the values of R
for the value of C
+ R × (C + C )
S/H par par I
+ C )/C )
par I S/H
ADC and VREF configuration: RES=0
(1)
(12-bit mode), VRSEL= 0h (VDD = 3.3V),
ADC t
sample
-40℃ ≤ T
ADC and VREF configuration: RES=0
(2)
(12-bit mode), VRSEL= 0h (VDD = 3.3V),
ADC CHANNEL=11
BUFCONFIG = 0
BUFCONFIG = 1
BUFCONFIG = 1
BUFCONFIG = 0
BUFCONFIG = {0, 1}, No load
(1)
Drive strength supported on VREF+ device pin
Product Folder Links: MSPM0G3507-Q1 MSPM0G3506-Q1 MSPM0G3505-Q1
MSPM0G3507-Q1, MSPM0G3506-Q1, MSPM0G3505-Q1
ADC Model
S1 R
in
12-bit SAR
Converter
C
S/H
C
I
and C
in S/H
I
TEST CONDITIONS
= 12.5uS
≤ 130℃
j
TEST CONDITIONS
TEST CONDITIONS
SLASF88 – OCTOBER 2023
MIN TYP MAX UNIT
27 30 33
-1.9 -1.8 -1.7 mV/℃
12.5
MIN TYP MAX UNIT
2.7
1.62
1.38 1.4 1.42
2.46 2.5 2.54
MIN TYP MAX UNIT
166 330
100
100
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℃
us
V
V
µA
µA
mA
41