Table of Contents
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3
To perform the self-tests 3–3
To make the test connectors (logic analyzer) 3–7
To test the threshold accuracy (logic analyzer) 3–9
To test the glitch capture (logic analyzer) 3–18
To test the single-clock, single-edge, state acquisition (logic analyzer) 3–24
To test the multiple-clock, multiple-edge, state acquisition (logic analyzer) 3–37
To test the single-clock, multiple-edge, state acquisition (logic analyzer) 3–49
To test the time interval accuracy (logic analyzer) 3–60
To test the CAL OUTPUT ports (oscilloscope) 3–65
To test the input resistance (oscilloscope) 3–69
Perform an operational accuracy calibration 3–72
To test the voltage measurement accuracy (oscilloscope) 3–73
To test the offset accuracy (oscilloscope) 3–77
To test the bandwidth (oscilloscope) 3–82
To test the time measurement accuracy (oscilloscope) 3–87
To test the trigger sensitivity (oscilloscope) 3–91
Performance Test Record (logic analyzer) 3–95
Performance Test Record (oscilloscope) 3–101
Performance Test Record (pattern generator) 3–104
Testing Performance
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