HP 1660C Series Service Manual page 225

Logic analyzers
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Theory of Operation
System Tests (System PV)
HP-IB Test
The HP-IB test performs a write/read operation to each of the registers of the HP-IB IC. A
test pattern is written to each register in the HP-IB IC. The pattern is then read and
compared with a known value.
Passing the HP-IB test implies that the read/write registers in the HP-IB IC can store a logical
"1" or a logical "0," and that the HP-IB IC is functioning properly. Incoming and outgoing
HP-IB information will not be corrupted by the HP-IB IC.
RS-232-C Test
This test checks the basic interface functions of the RS-232-C port. Both internal and
external portions of the port circuitry are tested. In order for the RS-232-C test to pass, the
RS-232-C loopback connector must be installed on the RS-232-C connector.
PS2 Test
The PS2 test exercises the PS2 interface between the logic analyzer and external keyboard, if
an external keyboard is connected. First, a read/write operation is performed to each of the
registers of the PS2 IC. A test pattern is written to each memory location, read, and
compared with a known value. Second, if an external keyboard is connected to the PS2 port,
the keyboard controller that resides in the keyboard is polled by the microprocessor. A test
pattern is sent to the keyboard controller and returned to the microprocessor by the keyboard
controller. The test pattern is then compared with a known value.
Passing the PS2 test implies that the read/write registers in the PS2 IC can store a logical "1"
or a logical "0," and that the PS2 IC is functioning properly. Also, passing the PS2 test implies
that the PS2 pathway to the external keyboard is functioning and that the keyboard controller
can communicate with the microprocessor in the logic analyzer. Incoming PS2 information
from the external keyboard will not be corrupted by the pathway between the keyboard
controller and microprocessor.
Disk Test
The disk test verifies the operation of both the flexible disk drive and hard disk drive.
For the flexible disk drive, the disk test exercises the disk controller circuitry by performing a
write/read on a disk. Either a LIF formatted disk with 20 sectors available space or DOS
formatted disk with 5K available space is required and should be inserted in the disk drive.
When the disk test is executed the disk is first checked sector by sector to find any bad
sectors. If no bad sectors are found a test file will be created on the disk and test data will be
written to the file. The file is then read and the test data compared with known values. The
test file is then erased at the conclusion of the test.
For the hard disk drive, the disk test exercises the disk controller that is on the hard disk
drive assembly. In addition, the buffers that make up the hard disk drive interface are tested.
When the test is executed, the sectors of the hard disk are checked, and then write/read
tested like the flexible disk drive.
Passing the disk test implies that the flexible disk controller circuitry in the logic analyzer and
the disk read/write circuitry in the flexible disk drive are functioning properly. The flexible
disk drive can read and write to a LIF or DOS formatted disk, and the data will not be
corrupted by the flexible disk drive circuitry. Passing the disk test also implies that the hard
disk drive controller circuitry, interface, and read/write circuitry are functioning properly, and
that the data will not be corrupted by the hard disk drive circuitry.
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