Spectrum Emission Mask (Sem) - JDS Uniphase CellAdvisor JD780A Series User Manual

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Spectrum emission mask (SEM)

The Spectrum Emission Mask (SEM) measurement is to identify and determine the power level of out-
of-band spurious emission outside the necessary channel bandwidth and modulated signal. It
measures the power ratio between in-band and adjacent channels. The JD780A series indicates either
Pass or Fail based on the specified limit of the signal.
Setting measure setup
After configuring test parameters as described in the "Configuring test parameters" on page 125, you
can continue your measurement.
Procedure
1.
Press the MEASURE SETUP hot key.
2.
Press the Time Slot soft key to assign a time slot with which performs measurements, and then
select your desired time slot number from 0 to 7.
3.
Optional. To set the delay, complete the following steps:
a.
Press the Miscellaneous soft key.
b.
Press the Delay soft key to set the amount of delay in µs.
c.
Enter a value by using the numeric keys. You can also use the rotary knob.
d.
Press the µs soft key.
NOTE
The Delay setting is used only when there is a time offset in the signals to be measured.
Measurement example
Figure 42
SEM measurement with GSM signal analyzer
Using GSM/GPRS/EDGE Signal Analyzer
JD780A Series Analyzers
133

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