Add-On Instruction Scan Times - Rockwell Automation Allen-Bradley 1715-AENTR User Manual

Redundant i/o system
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Table 46 - Maximum Scan Rates Measured - The L75 Controller was used for taking measurements.
Module
1715-AENTR
1715-IB16D
1715-IB16D
1715-IF16
1715-IF16
8. Create a tag with the appropriate Add-On Instruction data type for the
Requested Output Data.
.
9. Enter the module RPI.
To optimize system bandwidth, type the same RPI value from the module
configuration.

Add-On Instruction Scan Times

Add-On Instruction
AENTR_SIL2
IB16D_Simplex_SIL2
IB16D_Duplex_SIL2
IF16_Simplex_SIL2
IF16_Duplex_SIL2
Rockwell Automation Publication 1715-UM001J-EN-P - December 2020
Chapter 8
Using SIL 2 Add-On Instructions with 1715 Redundant I/O Modules
Duplex
Simplex
Duplex
Simplex
Duplex
Scan Rate µs (max measured)
455
340
378
831
832
235

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