Test Mode Operation - Mitsubishi Electric MELSEC-F FX3G Series User Manual

FX Series Programmable Controllers
3G
User's Manual - Hardware Edition

19.6.4 Test mode operation

There are 3 types of test mode operations, depending on the device type. The 3 operations are explained
below.
1. Data registers [D: D (16-bit), DD (32-bit)] / extended registers [R: R (16-bit), DR (32-bit) /
extended file registers [ER: ER (16-bit), DER (32-bit)]
1) Perform a monitor mode operation to display the device whose
current value is to be changed.
→ Refer to Subsection 19.6.2 for monitor function operation.
2) Hold the [OK] button for 1 second or longer to switch to the test
mode. The current value begins blinking (refer to fig. at right).
3) Use the [+] / [-] buttons to change the value as desired.
To cancel the operation and return to the "monitor screen", press
[ESC].
Button
ESC
-
+
OK
4) Press [OK] to register the current value and return to the "monitor screen".
• File register (D)
The display module's test function cannot be used to change the current value of the file register (D) which
is stored in the program memory.
Operation Description
Cancels the operation and returns to the "monitor screen".
Reduces the value. Hold for 1 second or longer for high-speed
reduction.
Increases the value. Hold for 1 second or longer for high-speed
increase.
Registers the current value and returns to the "monitor screen".
→ Refer to Subsection 19.6.1 for test mode subject devices.
19 Display Module (FX3G-5DM)
19.6 Monitor/Test Mode
D 1 2 0 0 0
D 1 2 0 1 0
D 1 2 0 2 0
D 1 2 0 3 0
D 1 2 0 0 0
D 1 2 0 1 0
D 1 2 0 2 0
D 1 2 0 3 0
D 1 2 0 0
D 1 2 0 1 1 0 0
D 1 2 0 2
D 1 2 0 3
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