MICRO-EPSILON interferoMETER IMS5420 Quick Manual page 19

Initial Operation
Example of silicon with paste and gap, measurement peak sorting: First, selected material
IMP-TH
Peak 4
Silicon
Peak 6 Gap
0 20 40
The IMS5420MP and IMS5420IP67MP controllers can also measure the thickness of combined layers of the same
material.
A material does not necessarily have to be selected for layer 4. Peak 4 stands for a combination layer of paste and
silicon. The controller evaluates this layer; however, the result has no significance in the measurement.
IMS5420-TH / IMS5420MP-TH / IMS5420IP67-TH / IMS5420IP67MP-TH
Peak 1
Peak 3
Peak 5
Peak 2
Range [%] 60 80 100
Page 19