Electrical Sensitivity Characteristics; Table 40. Emi Characteristics - STMicroelectronics STM32F038C6 Manual

STM32F038x6
Software recommendations
The software flowchart must include the management of runaway conditions such as:
• Corrupted program counter
•
Unexpected reset
•
Critical Data corruption (for example control registers)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Symbol Parameter
S
EMI
6.3.11

Electrical sensitivity characteristics

Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.

Table 40. EMI characteristics

Conditions
V = 1.8 V, T
DD
LQFP48 package
Peak level
compliant with
IEC 61967-2
DocID026079 Rev 3
Monitored
frequency band
0.1 to 30 MHz
= 25 °C,
A
30 to 130 MHz
130 MHz to 1 GHz
EMI Level
Electrical characteristics
Max vs. [f /f ]
HSE HCLK
8/48 MHz
-1
21 dBµV
27
4
61/102
Unit
-
79