Electrical Sensitivity Characteristics; Table 37. Emi Characteristics; Table 38. Esd Absolute Maximum Ratings - STMicroelectronics STM32L100RC Manual

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STM32L100RC
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Symbol Parameter
S
EMI
6.3.11

Electrical sensitivity characteristics

Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Symbol
V
ESD(HBM)
V
ESD(CDM)
1. Guaranteed by characterization results, not tested in production.
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Table 37. EMI characteristics

Conditions
= V,
V
DD
= 25 °C,
T
A
Peak level
package
compliant with IEC
61967-2

Table 38. ESD absolute maximum ratings

Ratings
Electrostatic discharge
voltage (human body
model)
Electrostatic discharge
voltage (charge device
model)
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Monitored
frequency band
range 3
0.1 to 30 MHz
30 to 130 MHz
130 MHz to 1GHz
SAE EMI Level
Conditions
= +25 °C, conforming to
T
A
JESD22-A114
= +25 °C, conforming to
T
A
ANSI/ESD STM5.3.1.
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Max vs. frequency range
4 MHz 16 MHz
32 MHz
voltage
voltage voltage
range 1
range 2
3 -6 -5
18 4 -7
15 5 -7
2.5 2 1
Maximum
Class
value
2 2000
II 500
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Unit
dBµV
-
Unit
(1)
V
V
71/104
96