Compliance statements and recycling ............8 Compliance statements ..................8 Recycling ......................9 PC requirements ....................9 Introduction ....................10 SPECTANO 100 ....................10 Methods ......................10 DTS1 dielectric test sample box ............... 11 Frequency domain spectroscopy (FDS)............11 Polarization current method (PDC) ..............11 Combined mode (FDS and PDC) ..............
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Typical setup for a test cell with guard ring ............30 9.4.2 Typical setup for a test cell without guard ring ........... 31 Connect SPECTANO 100 to the DTS1 dielectric test sample box ..... 33 Connect SPECTANO 100 to Dielectric Sample Holder DSH 100…………… .. 34 ................35 SPECTANO Analyzer Suite 10.1 Start view ......................
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Contents Technical data ....................70 12.1 Output ......................70 12.2 Input ......................... 70 12.3 Frequency range of ..................70 12.4 Measurement range ..................70 12.5 Measurement accuracy @ 23 ºC ±5 ºC ............71 12.6 Measurement time (Combined mode) .............. 71 12.7 DRA power supply ....................
Moreover, it includes a detailed description of the SPECTANO Analyzer Suite. The SPECTANO 100 User Manual is available in PDF format on the DVD delivered with SPECTANO 100 and can be accessed directly on the OMICRON Lab website www.omicron-lab.com.
OMICRON Lab before proceeding. When working with SPECTANO 100, observe the five safety rules (see chapter 2.2 "Five safety rules" ) and all other safety instructions in this User Manual.
Any maloperation can result in damage to property or persons. ► Use SPECTANO 100 and its accessories only in a technically sound condition and when its use is in accordance with the safety regulations for the specific job site and application.
SPECTANO 100 and its accessories like the DTS1 dielectric test sample box may be used only as described in the SPECTANO 100 Quick Start Guide or the User Manual. Any other use is not in accordance with the local safety regulations. The manufacturer and the distributor are not liable for damage resulting from improper usage.
If SPECTANO 100 or its accessories are used in a manner not specified by the manufacturer or used with third party test devices and cables, the protection provided by SPECTANO 100 or its accessories may be impaired, and this may result in damage to property or persons.
Compliance statements and recycling Recycling This test set (including all accessories) is not intended for household use. At the end of its service life, do not dispose of the test set with household waste! For customers in EU countries (incl. European Economic Area) OMICRON test sets are subject to the EU Waste Electrical and Electronic Equipment Directive 2012/19/EU (WEEE directive).
Introduction SPECTANO 100 SPECTANO 100, in conjunction with its accessories or as stand-alone unit, is a test system for dielectric analysis of solid and liquid materials. It combines the time-domain and frequency-domain analysis within a wide frequency range from 20 μHz up to 5 kHz in one device and provides an output voltage range from 100 mV to 200 V .
The DTS1 dielectric test sample box is an accessory for demonstrating and testing the functionality of SPECTANO 100 without a sample test cell. The DTS1 is a demo box containing two samples: a high- precision, low-loss 1 nF capacitor and a RC circuit simulating a dielectric sample with losses. The main application areas of the DTS1 are in training and demonstration purposes but it can also be used for detecting errors in a cable setup.
Picture SPECTANO 100 main device OL000400 DTS1 dielectric sample test box 2 ×Triaxial standard cable (1.5 m) Specific grounded SPECTANO 100 power supply CD ROM incl. SPECTANO Analyzer Suite and User Manual (English) Quick Start Guide (printed) (English) USB cable (1.5 m)
► Always ensure that no dangerous voltages are present at any touchable part of the device. ► Before handling SPECTANO 100 in any way, connect its equipotential ground terminal with a solid connection of at least 6 mm cross-section and not longer than 20 meters to the ground terminal in the laboratory.
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• An error has occurred during measurement (Measurement is stopped.). After a computer has been connected to SPECTANO 100, the error information is sent to the computer and the LED is on. On or blinking Signals dangerous voltage on the OUTPUT connector.
► Only use the delivered grounded AC power supply DRA SUPPLY to power ► SPECTANO 100. ► Connect the SPECTANO 100 power supply only to a power outlet that is equipped with protective ground (PE). DC power input Connect only the especially designed and...
DANGER Death or severe injury caused by high voltage or current ► Use the DTS1 box only together with the SPECTANO 100 test device and the delivered accessories and cables. ► Read the safety instructions in 2 "Safety instructions" in this User Manual before using the DTS1 box together with the SPECTANO 100 test device.
Preparation of test material and test cell Preparation of test material and test cell Solid materials The following sections base on the international standards for analysis of the dielectric properties of solid electrical insulation like ASTM D150-18 (ASTM D150-11), D-257-14, IEC 62631-2-1-2018-02 (IEC 60250) or IEC 62631-3-1.
SPECTANO 100 User Manual Flatness The surface of the test material must be flat at all points. If the surface of the test material is not flat, an air gap between the electrode and the solid test material causes measurement errors.
Preparation of test material and test cell Liquid materials The following sections base on the international standards for analysis of the loss characteristics and permittivity of liquid electrical insulation like ASTM D924-15 (ASTM D924-08) or IEC 60247-2004-02. 7.2.1 Preparation of liquid material test cells Cleaning the test cell is of paramount importance when measuring the dielectric characteristics because they are defected by the presence of conductive contaminations or moisture on the test cell surfaces.
SPECTANO 100 User Manual Setup improvements Error correction To eliminate, for example, the stray capacitances and unknown capacitances between the leads of the used test cell, we recommend performing reference measurements by using a reference material with a known permittivity (e.g. air). The following error correction is based on the air reference example and proceeds as follows: 1.
Setup improvements 2. Perform the air reference measurement(s) by using SPECTANO Analyzer Suite as described in 10.4 "Perform reference measurements" . Note: We recommend adjusting the air space height equal to the thickness of the sample probe under test. If it is not possible, we recommend performing two air reference measurements with different air spaces.
SPECTANO 100 User Manual 8.2.1 Thin film electrodes or coating A simple solution to avoid high pressure on the material sample and to improve the contact between sample material and electrode is the measurement with thin film electrodes or an additional coating surface.
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Setup improvements Figure 8-5 Measurement circuit, unguarded electrode (C is stray capacitance) When using a guard electrode, the stray capacitances will be guarded as shown in the following figures. With this setup it is possible to measure the dielectric properties of the solid test material accurately, because the stray capacitances are not measured.
SPECTANO 100 User Manual Figure 8-7 Measurement circuit, guarded electrode (C is stray capacitance) Stable environment The permittivity and dielectric losses vary with temperature and humidity. Therefore, we recommend measuring the sample in a stable environment. Shielding of low signal measurements...
Installation Installation Before operating SPECTANO 100 for the first time, use the delivered packing list to verify that all components of the test system are available. DANGER Avoid serious injury or death caused by worn-out, chafed, or otherwise damaged parts of SPECTANO 100 or its accessories.
To connect SPECTANO 100 to the computer: 1. Connect the USB 2.0 or higher cable to the USB connector on the SPECTANO 100 rear panel. 2. Connect the USB cable to the USB connector of your computer by using the delivered USB 2.0...
Installation Connect SPECTANO 100 to a test object You can connect SPECTANO 100 to a test cell for liquid or solid materials. This section describes how to connect SPECTANO 100 to the most common test cell types. DANGER Avoid serious injury or death caused by carrying out the testing procedure incorrectly.
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Standard connection cable is the delivered high-temperature low-noise triaxial cable with a 1:1 connection of the inner conductor, the inner shield (guard) and the outer shield (ground). Connect the red-labeled cable to the OUTPUT connector of SPECTANO 100 and the blue-labeled cable to the INPUT connector of SPECTANO 100.
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Installation Depending on the connection type of the test cell, OMICRON Lab offers the following adapters: • High-temperature low-noise triaxial-to-BNC adapter with inner and outer shield connected to the BNC outer shield BNC (coaxial) Cable (triaxial) Inner conductor Outer shield (ground)
SPECTANO 100 User Manual To connect the adapter cable to SPECTANO 100: 1. Connect the standard triaxial cable according to the color code to the SPECTANO 100 OUTPUT and INPUT connectors. 2. Connect the adapter cables with the corresponding color code to the standard triaxial cable.
To connect SPECTANO 100 to a test cell with guard ring: 1. Ground SPECTANO 100 according to the safety rules (see chapter 2.2 "Five safety rules"). 2. Connect the standard triaxial cable according to the color code to the SPECTANO 100 OUTPUT and INPUT connectors: Red-labeled cable to the OUTPUT connector •...
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To connect SPECTANO 100 to a test cell without guard ring: 1. Ground SPECTANO 100 according to the safety rules (see chapter 2.2 "Five safety rules"). 2. Connect the standard triaxial cable according to the color code to the SPECTANO 100 OUTPUT and INPUT connectors: Red-labeled cable to the OUTPUT connector •...
Connect SPECTANO 100 to the DTS1 dielectric test sample box To test the functionality of SPECTANO 100 without a sample cell, connect SPECTANO 100 to the DTS1 dielectric test sample box by using the delivered standard triaxial cables as shown in the following figure.
SPECTANO 100 User Manual Connect SPECTANO 100 to Dielectric Sample Holder DSH 100 Connect SPECTANO 100 to OMICRON Lab’s DSH 100 Dielectric Sample Holder by using the delivered triaxial cables as shown in the following figure Figure 9-7 Connecting SPECTANO 100 to DSH 100...
SPECTANO Analyzer Suite SPECTANO Analyzer Suite In this chapter you will learn how to test dielectric materials with SPECTANO Analyzer Suite and manage the test data. The chapter is structured as follows: • Section 10.1 "Start view" gives you an overview on the SPECTANO Analyzer Suite start view.
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Open another file Opens a dialog box for selecting the file you want to open. Open manual Opens the SPECTANO 100 User Manual. SPECTANO Analyzer Suite supports the following file formats. Table 10-3 Supported file formats File name extension Description .spt...
SPECTANO Analyzer Suite 10.2 Create a new test When creating a new test, SPECTANO Analyzer Suite guides you through the test workflow. This section describes the test workflow step by step. To create a new test: 1. Start SPECTANO Analyzer Suite. 2.
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SPECTANO 100 User Manual 6. We recommend correcting measurements to improve the accuracy of the measurement results. The purpose of this correction is to eliminate the unknown capacitances like stray capacitance or capacitance between connecting leads or between leads and the electrodes and to correct any measurement offset.
SPECTANO Analyzer Suite 10.3 Perform measurements After you have created a new test, you can add measurements to the test. By default, every test includes at least one measurement. You can add additional measurements and clone (copy a measurement with settings but without results) selected measurements.
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SPECTANO 100 User Manual 4. To delete a specific measurement, select the measurement in the Navigation list and click the button Remove selected measurement on the ribbon or in the context menu of the selected measurement. To delete all measurements, click the Remove all measurements button...
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Material Measurement(s) context menu. The status bar at the bottom of the test view displays the status of SPECTANO 100 device on the right sight of the status bar • the setting status of the test file settings (locked...
SPECTANO 100 User Manual 10.4 Perform reference measurements 10.4.1 Measurement procedure To perform reference measurements: Reference 1. Start SPECTANO Analyzer Suite. settings 2. In the start view, click the New test button . The test view opens with the File tab selected on the ribbon. On the left of the test view, the Navigation pane displays the steps of the test workflow.
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SPECTANO Analyzer Suite 5. In the Navigation pane, click Sweep settings, and then enter the settings (see Table 10-11 "Sweep settings".) Note: The sweep settings depend on the measurement mode selected under Measurement mode. 6. In the Navigation pane, click Reference measurement(s), and follow the instructions and recommendations displayed in the test view.
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SPECTANO 100 User Manual The reference measurement is running, and the measurement results are displayed in the graph view. After the first reference measurement has finished, the Start reference button displays the status performed Click Start next to Reference (2).
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SPECTANO Analyzer Suite Cylindrical electrodes and other geometries In this case, perform one reference measurement: Cylindrical electrodes 1. In the Navigation pane, click Reference measurement(s), and then click Graph and result table. On the ribbon, the Reference(s) tab is selected automatically.
SPECTANO 100 User Manual 10.4.2 Correction procedure You can perform the procedure for correcting the measured material capacitance before or after performing the material measurements. In both cases, the error correction proceeds as follows: Graph and result table In the Navigation pane, click Material measurement(s), the...
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SPECTANO Analyzer Suite Cylindrical The following correction procedure applies to the Cylindrical electrodes. For electrodes other geometries see “Reference measurement for other geometries” earlier in this section. In this case, only one reference measurement is to be performed. If you click the Reference button on the ribbon, the capacitance results and thus the permittivity, tanδ...
SPECTANO 100 User Manual 10.5 Perform analysis To perform an analysis, use the analysis Excel file macros provided by OMICRON Lab, available at www.omicron-lab.com. 10.6 View measurement results This section describes the workspace for viewing measurement results. To open the result view workspace, click Graph and result table under Reference measurement(s) or Material measurement(s) in the Navigation pane.
SPECTANO Analyzer Suite 10.6.1 Numerical results The measurement results are displayed numerically on the top of the result view workspace. You can display the measurement results in frequency domain and in time domain. For information on how to select the result display, see 10.6.3 "Result view controls".
SPECTANO 100 User Manual Table 10-6 Numerical measurement results (time domain) (continued) Data Description G(t) Measured electrical conductivity over time Measured specific resistance over time ρ(t) Measured specific conductivity over time σ(t) Polarization index Index of how fast the depolarization current is...
SPECTANO Analyzer Suite 10.6.3 Result view controls With the control options on the right of the result view workspace, you can control how the measurement results are displayed. The following table describes the result view controls. Table 10-8 Result view controls Control Description Chart result view...
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SPECTANO 100 User Manual Table 10-8 Result view controls (continued) Control Description Cursor table Impedance calculation Parallel circuit Select the parallel equivalent circuit as dielectric model. Serial circuit Select the serial equivalent circuit as dielectric model. x-Axis Xmax Select the maximum value of the right x-axis.
Date and time the measurement started SPECTANO Analyzer Suite supports testing with the following test cell configurations: • Test cell with disk electrodes OMICRON Lab’s Dielectric Sample Holder DSH 100 (disk electrode type) • • Test cell with cylindrical electrodes Other geometries •...
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SPECTANO 100 User Manual Table 10-10 Test cell settings (continued) Data Description Outer diameter of sample Outer diameter of the material sample Guard gap (g) Gap of the guard ring Electrode length (l) Length of the test cell’s electrode 1. Depends on the test cell type selected under Test cell configuration.
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SPECTANO Analyzer Suite Table 10-11 Sweep settings (continued) Data Description PDC points per decade Sample points per decade when using the PDC method Restore default list Restore the list by resetting the start frequency, stop frequency and points per decade. Frequency sweep list Displays the specified frequency points defined automatically (fixed list) or by a customer...
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SPECTANO 100 User Manual The following table describes the reference settings. Table 10-12 Reference settings Data Description General measurement settings Temperature Temperature of the test cell/sample Humidity Environmental relative humidity Reference settings Material type Type of the material for reference measurement...
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SPECTANO Analyzer Suite Table 10-12 Reference settings (continued) Data Description Select the Standard or Improved option for the Noise suppression suppression of the noise interference. If you select Improved, the noise-to-signal ratio and, consequently, the measurement accuracy will be improved but the measurement time will increase. Pre-measurement checks Check for noise and Select the...
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SPECTANO 100 User Manual Table 10-13 Measurement settings (continued) Data Description Sample thickness at position E Position E Average thickness of the material sample Average (h) Accuracy of the sample uniformity Max. uniformity Vacuum capacitance Vacuum capacitance of the test cell...
SPECTANO Analyzer Suite 10.8 Commands File tab On the File tab on the test view ribbon, SPECTANO Analyzer Suite provides the following commands. Figure 10-6 Test view ribbon: File tab Table 10-14 Commands on the File tab Command Description Save Saves a test file.
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SPECTANO 100 User Manual Measurement(s) On the Measurement(s) tab on the test view ribbon, SPECTANO Analyzer Suite provides the following commands. Figure 10-7 Test view ribbon: Measurement(s) tab Table 10-15 Commands on the Measurement(s) tab Command Description Start selected Starts the measurement selected in the...
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SPECTANO Analyzer Suite Commands on the Measurement(s) tab (continued) Table 10-16 Command Description Load from Load the results from the device to the selected device measurement. Note: The settings are not loaded. For more information, see 10.10 "Load from the device". Clone selected Creates a copy of the selected material measurement...
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SPECTANO 100 User Manual Table 10-17 Commands on the Reference(s) tab Command Description Start Opens a submenu in which you can select to perform reference measurement (1) or (2) Stop Stops the reference measurement. Clear selected Opens a drop-down list from which you can select...
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SPECTANO Analyzer Suite Graph view On the Graph view tab on the test view ribbon, SPECTANO Analyzer Suite provides the following commands. This tab is only visible if the Reference or Material measurement Graph and Result view is selected. Test view ribbon: Measurement(s) tab Figure 10-9 Table 10-18 Commands on the Measurement(s) tab...
SPECTANO 100 User Manual 10.9 Home view The SPECTANO Analyzer Suite home view provides access to the frequently used commands. To open the home view, click the Home tab on the test view ribbon. Figure 10-10 SPECTANO Analyzer Suite home view In the home view, SPECTANO Analyzer Suite provides the following commands.
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SPECTANO Analyzer Suite Table 10-21 Commands in the home view (continued) Command Description Analysis Opens the analysis view (see 10.5 "Perform analysis"). Options Opens a dialog box for setting general options (see Figure 10-11 "Options dialog box" and Table 10-22 "SPECTANO Analyzer Suite options").
Improvement Program SPECTANO Analyzer Suite without interrupting you. This helps OMICRON Lab to identify which features to improve. No collected information is used to identify or contact you. We encourage you to join the program to help improving SPECTANO Analyzer Suite.
SPECTANO Analyzer Suite 10.9.2 Anti-Alias settings In computer graphics, anti-aliasing is a graphic filter which improves the appearance of polygon edges, so they are not "jagged" but are smoothed out on the screen. With these settings, the chart view can be improved by smoothing the chart lines, markers, grid lines and text.
SPECTANO 100. • • SPECTANO 100 is switch on. After the power supply and the USB cable are connected and SPECTANO 100 is switched on, the status bar will show Device connected 11.2 Lost communication The loss of power supply can cause loss of communication between SPECTANO 100 and the computer.
If, for example, an error occurs during a measurement, the settings and the results are saved in the backup file. You can find the backup file on your hard disk in ProgramData\OMICRON Lab\ Spectano Analyzer\Backup. Note: The backup file will be deleted after the test file has been saved.
SPECTANO 100 User Manual Technical data 12.1 Output Voltage range ±100 mV to ±200 V peak Max. current 50 mA peak 12.2 Input input resistance <2 Ω input resistance 2 kΩ FDS measurement current ≤50 mA peak PDC measurement current ≤10 mA...
SPECTANO 100 User Manual 12.9 Mechanical data Dimensions (w × h × d) 260 mm × 50 mm × 256 mm (10.25 inch × 2 inch × 10.5 inch) Weight 2.3 kg (5 lb) Test cell configurations 13.1 About this chapter...
Technical data 13.3 Disk electrode with Guard ring 13.3.1 IEC standards According to the latest IEC standards for the analysis of dielectric and resistive properties of solid and liquid insulating materials • IEC 62632-2-1-2018-02: AC methods for solid insulating material analysis •...
SPECTANO 100 User Manual 13.3.3 Test cell type selection in SPECTANO Analyzer Suite Although you have a Disk electrode with Guard ring, the selection in the software depends on the vacuum capacitance c calculation and IEC/ASTM standard. Table 13-1 SPECTANO Analyzer Suite test cell selection according to different standards...
Technical data 13.3.4 Correction procedure Solid insulating materials Electrode systems with guarding and suitable connections ensure a precise measurement by shunting edge currents from spurious external voltages away from the measuring circuit. This reduces the probability of a measurement error significantly. In theory the edge capacitances c are zero.
SPECTANO 100 User Manual Liquid Insulating materials Edge capacitances are not the problem for the analysis of liquid insulating materials using a Disk electrode arrangement with Guard ring. Nevertheless, stray capacitances of the test cell or between the leads and to ground are influencing the measurement accuracy. We recommend performing the air reference correction steps described in the solid insulating material analysis chapter “Solid insulating...
13.4 DSH 100 (Dielectric Sample Holder) OMICRON Lab’s DSH 100 is a Disk electrode test cell with Guard ring and is designed for the analysis of solid insulating materials. The SPECTANO Analyzer Suite offers a DSH 100 test cell selection with pre-defined dimensions. Thus,...
SPECTANO 100 User Manual 13.5.2 ASTM standards The latest ASTM standards for the analysis of dielectric and resistive properties of solid and liquid insulating materials using Disk electrodes without Guard ring are: • D150-18: AC methods for solid insulating material analysis (replaced ASTM D150-11) D924-15: AC methods for liquid insulating material analysis •...
Technical data 13.5.4 Correction procedure Solid insulating materials Table 513-55 Electrode and sample size combination of un-guarded electrode setup Electrode and sample size combination Cross section/Profile Sample diameter = Electrode diameter Sample diameter ≠ Electrode diameter High voltage electrode diameter = Measurement electrode diameter Sample diameter ≠...
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SPECTANO 100 User Manual When measuring the dielectric properties of solid materials without guarding, the measurement is influenced by stray capacitances at the edge c of the solid test material, as shown in Figure 13-3. Figure 13-4 Measurement circuit, un-guarded electrode The influence of the edge capacitances is smallest for the case of electrodes extending to the edge of the specimen (electrode diameter = sample diameter) and largest for unequal electrodes.
Technical data 13.5.5 Coating Coatings are used to improve the contact between electrode and material surface. The diameter d for the calculation of the vacuum capacitance c depends on the coating type. Table 513-66 Disk electrode with Guard ring using different coating types Coating type Diameter d to enter in the SPECTANO Analyzer Suite...
SPECTANO 100 User Manual 13.6 Cylindrical electrode with Guard ring 13.6.1 IEC standards According to the IEC standards for the analysis of dielectric and resistive properties of solid and liquid insulating materials IEC 60250-1969: AC methods for solid insulating material analysis •...
Technical data 13.6.3 Test cell type selection in SPECTANO Analyzer Suite Table 613-88 SPECTANO Analyzer Suite test cell selection according to different standards Standards Vacuum capacitance SPECTANO Analyzer Suite selection 2 ∙ ( + ) = ∙...
SPECTANO 100 User Manual 13.6.4 Correction procedure Electrode systems with guarding and suitable connections ensure a precise measurement by shunting edge currents from spurious external voltages away from the measuring circuit. This reduces the probability of a measurement error significantly. In theory the edge capacitances c are zero.
Technical data 13.7.2 ASTM standards The latest ASTM standards for the analysis of dielectric and resistive properties of solid and liquid insulating materials using Cylindrical electrodes without Guard ring are: D150-18: AC methods for solid insulating material analysis (replaces ASTM D150-11) •...
There are two possibilities how to determine the vacuum capacitance of your measurement setup: 1. Calculation 2. Measurement using a LC meter or the SPECTANO 100 For the measurement you can use the SPECTANO 100 and the SPECTANO Analyzer Suite. Perform a measurement with an inserted solid or liquid material sample. Therefore, 1.
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Technical data 13.8.2 Correction procedure The automated air reference correction procedure according to the international standards is not implemented in the SPECTANO Analyzer Suite software for the selection ‘Other geometries’. If a correction of the results is needed, please use the possibility to “add measurements”. With this function you can perform, for example, an air reference measurement using one or more material measurements.
SPECTANO 100 User Manual Support When you are working with our products, we want to provide you with the greatest possible benefits. If you need any support, we are here to assist you! Technical support www.omicron-lab.com/support support@omicron-lab.com At our technical support hotline, you can reach well-educated technicians for all of your questions.