Correction Procedure; Correction Logic And Calculation - Omicron Lab SPECTANO 100 User Manual

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SPECTANO 100 User Manual
10.4.2

Correction procedure

You can perform the procedure for correcting the measured material capacitance before or after
performing the material measurements. In both cases, the error correction proceeds as follows:
1
In the Navigation pane, click Material measurement(s), the
opens automatically
Click the Reference button
2
calculation logic, see chapter 10.4.3 "Correction logic and calculation" ). Then all
measurements in the Navigation will be marked with the following icon
and the icon of the button will change to
3
To deactivate the correction again, click the Reference button
measurement results will be reset to the original data (not corrected), the icon in the
Navigation changes back to performed
, indicating that the correction is deactivated.
10.4.3

Correction logic and calculation

Reference sample
thickness is equal
to the material
sample thickness
Reference sample
thickness is not
equal to the
material sample
thickness
46
.
Disk electrodes and DSH 100 Dielectric Sample Holder
The following reference measurement procedure applies to the disk electrodes.
For the cylindrical electrodes and other geometries, see "Cylindrical electrodes
and other geometries" later in this section.
The correction logic and calculation differ depending on whether the reference
sample thickness is equal to the sample thickness of all material measurements
or the sample thickness for at least one material measurement is not equal to
the reference sample thickness.
In this case, only one reference measurement is to be performed. If you click the
Reference button
on the ribbon, the capacitance results and thus the
permittivity, tanδ and the impedance results of all measurements displayed in
the navigation pane, will be corrected according to the following formulas:
(air) = c'
(air) – c
c'
u
meas.
c''
(air) = c''
(air)
u
meas.
(material) = c'
c'
corrected
(material) = c''
c''
corrected
where c
is unknown stray capacitance.
u
Note: If you add a new measurement with the sample thickness h not equal to
the reference sample thickness after activating the correction of the
measurement results, the correction will be deactivated, and all corrected
measurements will be reset to the non-corrected results.
In this case, both reference measurements have to be performed. If you click the
Reference button
on the ribbon, the capacitance results and thus the
permittivity, tanδ and the impedance results of all measurements, displayed in
the navigation pane, will be corrected by using linear interpolation of the
reference measurement results. By interpolating the results, an approximate
value of c
(t) for the actual sample thickness h is found.
u
on the ribbon to correct all measurements. (For the
, indicating that the correction is active.
, and the icon of the button will change to
(air)
0
(material) – c'
(air)
meas.
u
(material) – c''
(air)
meas.
u
Graph and result table
(corrected),
. Then all
(Eq. 10-1)
(Eq. 10-2)
(Eq. 10-3)
(Eq. 10-4)

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